SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES

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Shanghai, CN

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
Electromagnetic absorption metamaterial
- Patent number 12,066,643
- Issue date Aug 20, 2024
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Tie Li
- G02 - OPTICS
Information Patent Grant
Compound eye camera device and compound eye system
- Patent number 12,041,331
- Issue date Jul 16, 2024
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xiaolin Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Gallium oxide semiconductor structure and preparation method therefor
- Patent number 11,955,373
- Issue date Apr 9, 2024
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xin Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting integrated circuit design method based on placement...
- Patent number 11,881,855
- Issue date Jan 23, 2024
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY...
- Jie Ren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser
- Patent number 11,876,340
- Issue date Jan 16, 2024
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Shan Qiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency surface acoustic wave resonator and method for makin...
- Patent number 11,804,821
- Issue date Oct 31, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xin Ou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature-insensitive Mach-Zehnder interferometer
- Patent number 11,796,738
- Issue date Oct 24, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Chao Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz spectrum measurement system and method for analyzing a te...
- Patent number 11,788,956
- Issue date Oct 17, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Hua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing graphene on platinum substrate
- Patent number 11,774,433
- Issue date Oct 3, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- He Kang
- G01 - MEASURING TESTING
Information Patent Grant
Micro-power wireless access method and apparatus for internet of th...
- Patent number 11,736,969
- Issue date Aug 22, 2023
- State Grid Jiangsu Electric Power Co., Ltd. Research Institute
- Jianhua Qin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for preparing multi-layer hexagonal boron nitride film
- Patent number 11,679,978
- Issue date Jun 20, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Zhiyuan Shi
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Read-out circuit and read-out method for three-dimensional memory
- Patent number 11,568,931
- Issue date Jan 31, 2023
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Yu Lei
- G11 - INFORMATION STORAGE
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,443,941
- Issue date Sep 13, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for improving counting rate of superconducting na...
- Patent number 11,402,266
- Issue date Aug 2, 2022
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Lixing You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,393,712
- Issue date Jul 19, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method related to tuning the performance of superconducting nanowir...
- Patent number 11,380,834
- Issue date Jul 5, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEMS AND INFORMATION TECHNOLOGY, CHINESE ACADEM...
- Xin Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat shield structure for single crystal production furnace and sin...
- Patent number 11,352,713
- Issue date Jun 7, 2022
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for preparing film bulk acoustic wave device by using film t...
- Patent number 11,336,250
- Issue date May 17, 2022
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xin Ou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for adjusting and controlling boundary of graphene
- Patent number 10,928,304
- Issue date Feb 23, 2021
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Haomin Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nitrogen oxide gas sensor based on sulfur doped graphene and prepar...
- Patent number 10,908,107
- Issue date Feb 2, 2021
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Tie Li
- G01 - MEASURING TESTING
Information Patent Grant
Phase-change type vanadium oxide material and preparation method th...
- Patent number 10,858,728
- Issue date Dec 8, 2020
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xin Ou
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fluorinated graphene passivated AlGaN/GaN-based HEMT device and man...
- Patent number 10,770,556
- Issue date Sep 8, 2020
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xinhong Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read circuit of storage class memory with a read reference circuit,...
- Patent number 10,679,697
- Issue date Jun 9, 2020
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Yu Lei
- G11 - INFORMATION STORAGE
Information Patent Grant
Undulator
- Patent number 10,624,200
- Issue date Apr 14, 2020
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Shan Qiao
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Film-forming silica sol, method of preparing the same, and applicat...
- Patent number 10,604,662
- Issue date Mar 31, 2020
- SHANGHAI XINANNA ELECTRONIC TECHNOLOGY CO., LTD
- Yongxia Wang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Battery management chip circuit on the base of silicon on insulator...
- Patent number 10,608,014
- Issue date Mar 31, 2020
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xinhong Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrahigh resolution magnetic resonance imaging method and apparatus
- Patent number 10,539,633
- Issue date Jan 21, 2020
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Lei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Phase change material for phase change memory and preparation metho...
- Patent number 10,411,187
- Issue date Sep 10, 2019
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Feng Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless sensor network architecture based on multifunctional and c...
- Patent number 10,368,392
- Issue date Jul 30, 2019
- BEIJING INSTITUTE OF INFORMATION TECHNOLOGY
- Yuhong Chen
- G06 - COMPUTING CALCULATING COUNTING

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Patents Applicationslast 30 patents

Information Patent Application
PROCESS MANAGEMENT METHOD AND ELECTRONIC DEVICE
- Publication number 20240427730
- Publication date Dec 26, 2024
- Huawei Technologies Co., Ltd
- Xiaogang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387241
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387171
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE
- Publication number 20240218564
- Publication date Jul 4, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR PREPARING SILICON-ON-INSULATOR
- Publication number 20240153764
- Publication date May 9, 2024
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION METHOD OF P-TYPE HIGH-RESISTANCE AND ULTRA-HIGH-RESISTA...
- Publication number 20240141547
- Publication date May 2, 2024
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Application
SOI WAFER
- Publication number 20240096645
- Publication date Mar 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-NANO STRUCTURE SENSITIVE TO LASER BEAM IN SPECIFIC DIRECTION
- Publication number 20240004130
- Publication date Jan 4, 2024
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Haiyang HUANG
- G02 - OPTICS
Information Patent Application
METHOD OF GROWING A SINGLE-CRYSTAL SILICON
- Publication number 20230323561
- Publication date Oct 12, 2023
- ZING SEMICONDUCTOR CORPORATION
- Yinfeng LI
- C30 - CRYSTAL GROWTH
Information Patent Application
SELECTOR MATERIAL, SELECTOR UNIT AND PREPARATION METHOD THEREOF, AN...
- Publication number 20230276638
- Publication date Aug 31, 2023
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Min ZHU
Information Patent Application
SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF
- Publication number 20230178366
- Publication date Jun 8, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING GRAPHENE ON PLATINUM SUBSTRATE
- Publication number 20230160868
- Publication date May 25, 2023
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- He KANG
- G01 - MEASURING TESTING
Information Patent Application
PROCESS OF SURFACE TREATMENT OF SOI WAFER
- Publication number 20230133916
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE TREATMENT OF SOI WAFER
- Publication number 20230137599
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME
- Publication number 20230134308
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...
- Publication number 20230133092
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING THE SURFACE ROUGHNESS OF A SILICON-ON-INSULATO...
- Publication number 20230137992
- Publication date May 4, 2023
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TREATING A WAFER SURFACE
- Publication number 20230138958
- Publication date May 4, 2023
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM OXIDE SEMICONDUCTOR STRUCTURE, VERTICAL GALLIUM OXIDE-BASED...
- Publication number 20230127051
- Publication date Apr 27, 2023
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xin OU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING METHOD OF RESISTIVITY OF A WAFER
- Publication number 20230040616
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
- Publication number 20230037569
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cryogenic memory cell and memory device
- Publication number 20230037252
- Publication date Feb 2, 2023
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Lei CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PREPARING PATTERNED GRAPHENE
- Publication number 20220396485
- Publication date Dec 15, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Hongyan ZHU
- C01 - INORGANIC CHEMISTRY
Information Patent Application
MICRO-POWER WIRELESS ACCESS METHOD AND APPARATUS FOR INTERNET OF TH...
- Publication number 20220361032
- Publication date Nov 10, 2022
- State Grid Jiangsu Electric Power Co., Ltd. Research Institute
- Jianhua Qin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...
- Publication number 20220333269
- Publication date Oct 20, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
PHASE CHANGE MATERIAL, PHASE CHANGE MEMORY CELL AND PREPARATION MET...
- Publication number 20220328761
- Publication date Oct 13, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Sannian SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-THROUGHPUT VAPOR DEPOSITION APPARATUS AND VAPOR DEPOSITION METHOD
- Publication number 20220290298
- Publication date Sep 15, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Weimin Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL
- Publication number 20220291145
- Publication date Sep 15, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONDUCTING INTEGRATED CIRCUIT DESIGN METHOD BASED ON PLACEMENT...
- Publication number 20220286137
- Publication date Sep 8, 2022
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- JIE REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER
- Publication number 20220255289
- Publication date Aug 11, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Shan QIAO
- H01 - BASIC ELECTRIC ELEMENTS

SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES

Organization

Patents Grantslast 30 patents

Method for characterizing defects in silicon crystal

Electromagnetic absorption metamaterial

Compound eye camera device and compound eye system

Gallium oxide semiconductor structure and preparation method therefor

Superconducting integrated circuit design method based on placement...

Laser

High-frequency surface acoustic wave resonator and method for makin...

Temperature-insensitive Mach-Zehnder interferometer

Terahertz spectrum measurement system and method for analyzing a te...

Method for characterizing graphene on platinum substrate

Micro-power wireless access method and apparatus for internet of th...

Method for preparing multi-layer hexagonal boron nitride film

Read-out circuit and read-out method for three-dimensional memory

Silicon on insulator structure and method of making the same

Method and system for improving counting rate of superconducting na...

Silicon on insulator structure and method of making the same

Method related to tuning the performance of superconducting nanowir...

Heat shield structure for single crystal production furnace and sin...

Method for preparing film bulk acoustic wave device by using film t...

Method for adjusting and controlling boundary of graphene

Nitrogen oxide gas sensor based on sulfur doped graphene and prepar...

Phase-change type vanadium oxide material and preparation method th...

Fluorinated graphene passivated AlGaN/GaN-based HEMT device and man...

Read circuit of storage class memory with a read reference circuit,...

Undulator

Film-forming silica sol, method of preparing the same, and applicat...

Battery management chip circuit on the base of silicon on insulator...

Ultrahigh resolution magnetic resonance imaging method and apparatus

Phase change material for phase change memory and preparation metho...

Wireless sensor network architecture based on multifunctional and c...

Patents Applicationslast 30 patents

PROCESS MANAGEMENT METHOD AND ELECTRONIC DEVICE

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE

METHOD FOR PREPARING SILICON-ON-INSULATOR

PREPARATION METHOD OF P-TYPE HIGH-RESISTANCE AND ULTRA-HIGH-RESISTA...

SOI WAFER

MICRO-NANO STRUCTURE SENSITIVE TO LASER BEAM IN SPECIFIC DIRECTION

METHOD OF GROWING A SINGLE-CRYSTAL SILICON

SELECTOR MATERIAL, SELECTOR UNIT AND PREPARATION METHOD THEREOF, AN...

SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF

METHOD FOR CHARACTERIZING GRAPHENE ON PLATINUM SUBSTRATE

PROCESS OF SURFACE TREATMENT OF SOI WAFER

SURFACE TREATMENT OF SOI WAFER

SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME

SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...

METHOD FOR IMPROVING THE SURFACE ROUGHNESS OF A SILICON-ON-INSULATO...

METHOD FOR TREATING A WAFER SURFACE

GALLIUM OXIDE SEMICONDUCTOR STRUCTURE, VERTICAL GALLIUM OXIDE-BASED...

MEASURING METHOD OF RESISTIVITY OF A WAFER

METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER

Cryogenic memory cell and memory device

METHOD FOR PREPARING PATTERNED GRAPHENE

MICRO-POWER WIRELESS ACCESS METHOD AND APPARATUS FOR INTERNET OF TH...

METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...

PHASE CHANGE MATERIAL, PHASE CHANGE MEMORY CELL AND PREPARATION MET...

HIGH-THROUGHPUT VAPOR DEPOSITION APPARATUS AND VAPOR DEPOSITION METHOD

METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL

SUPERCONDUCTING INTEGRATED CIRCUIT DESIGN METHOD BASED ON PLACEMENT...

LASER