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Shanghai, CN
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Patent Grant
Sample protection device for scanning electron microscopy
Patent number
12,040,156
Issue date
Jul 16, 2024
SHANGHAI NEMOR OPTOELECTRONIC TECHNOLOGY CO., LTD.
Xuan Tang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SAMPLE PROTECTION DEVICE FOR SCANNING ELECTRON MICROSCOPY
Publication number
20220216031
Publication date
Jul 7, 2022
SHANGHAI NEMOR OPTOELECTRONIC TECHNOLOGY CO., LTD
Xuan TANG
H01 - BASIC ELECTRIC ELEMENTS
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