S.I SEIKO CO., Ltd.

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Matsuyama-shi, JP

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Enclosure inspection method and apparatus thereof
- Patent number 7,697,745
- Issue date Apr 13, 2010
- Riken
- Chiko Otani
- G01 - MEASURING TESTING

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Apparatus and method for detecting scattered material by Terahertz...
- Publication number 20060043298
- Publication date Mar 2, 2006
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING

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