Sii Nano Technology Inc.

Organization

Chiba, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Transmission X-ray analyzer and transmission X-ray analysis method
- Patent number 8,912,503
- Issue date Dec 16, 2014
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 8,891,729
- Issue date Nov 18, 2014
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detection mechanism and scanning probe microscope usin...
- Patent number 8,869,311
- Issue date Oct 21, 2014
- SII NanoTechnology Inc.
- Ryusuke Hirose
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focused ion beam apparatus
- Patent number 8,822,945
- Issue date Sep 2, 2014
- SII NanoTechnology Inc.
- Kenichi Nishinaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing sample for atom probe analysis by FIB and f...
- Patent number 8,728,286
- Issue date May 20, 2014
- Sii Nano Technology Inc.
- Takashi Kaito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever, cantilever system, and probe microscope and adsorption...
- Patent number 8,719,959
- Issue date May 6, 2014
- Sii Nano Technology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal analyzer
- Patent number 8,708,556
- Issue date Apr 29, 2014
- SII NanoTechnology
- Kentaro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Cross section processing method and method of manufacturing cross s...
- Patent number 8,703,247
- Issue date Apr 22, 2014
- SII NanoTechnology Inc.
- Hidekazu Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
X-ray analyzer and mapping method for an X-ray analysis
- Patent number 8,705,698
- Issue date Apr 22, 2014
- SII NanoTechnology Inc.
- Hiroshi Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and method of adjusting charged par...
- Patent number 8,698,105
- Issue date Apr 15, 2014
- SII NanoTechnology
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and specimen analyzing method
- Patent number 8,664,598
- Issue date Mar 4, 2014
- SII NanoTechnology Inc.
- Masakatsu Hasuda
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged particle beam apparatus and sample processing and...
- Patent number 8,642,958
- Issue date Feb 4, 2014
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring vibration characteristics of cantilever
- Patent number 8,615,811
- Issue date Dec 24, 2013
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
- Patent number 8,611,493
- Issue date Dec 17, 2013
- SII NanoTechnology Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
- Patent number 8,608,373
- Issue date Dec 17, 2013
- SII NanoTechnology Inc.
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Stage for working, focused beam working apparatus and focused beam...
- Patent number 8,598,485
- Issue date Dec 3, 2013
- Sii Nano Technology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Friction force microscope
- Patent number 8,601,609
- Issue date Dec 3, 2013
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
X-ray transmission inspection apparatus and x-ray transmission insp...
- Patent number 8,596,866
- Issue date Dec 3, 2013
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for scanning probe microscope and scanning probe microsc...
- Patent number 8,601,608
- Issue date Dec 3, 2013
- Japan Science and Technology Agency
- Kenichi Maruyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focused ion beam system and sample processing method using the same
- Patent number 8,581,206
- Issue date Nov 12, 2013
- SII NanoTechnology Inc.
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a spring constant of a cantilever and scannin...
- Patent number 8,584,261
- Issue date Nov 12, 2013
- SII NanoTechnology Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 8,548,121
- Issue date Oct 1, 2013
- Sii Nano Technology Inc.
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cross-section processing and observation
- Patent number 8,542,275
- Issue date Sep 24, 2013
- SII NanoTechnology Inc.
- Masahiro Kiyohara
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,513,627
- Issue date Aug 20, 2013
- SII NanoTechnology Inc.
- Masayuki Maruo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 8,513,602
- Issue date Aug 20, 2013
- SII NanoTechnology Inc.
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential scanning calorimeter
- Patent number 8,496,374
- Issue date Jul 30, 2013
- SII Nano Technology, Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Probe aligning method for probe microscope and probe microscope ope...
- Patent number 8,495,759
- Issue date Jul 23, 2013
- SII NanoTechnology Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Defect repair apparatus and method for EUV mask using a hydrogen io...
- Patent number 8,460,842
- Issue date Jun 11, 2013
- SII NanoTechnology Inc.
- Takashi Ogawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray inspection device and X-ray inspection method
- Patent number 8,422,630
- Issue date Apr 16, 2013
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 8,408,789
- Issue date Apr 2, 2013
- SII NanoTechnology Inc.
- Toshiyuki Takahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20130180019
- Publication date Jul 11, 2013
- SII NANOTECHNOLOGY INC.
- Masafumi WATANABE
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR PREPARING LAMELLA
- Publication number 20130175446
- Publication date Jul 11, 2013
- SII NANOTECHNOLOGY INC.
- Ikuko NAKATANI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE BEAM APPARATUS
- Publication number 20090008572
- Publication date Jan 8, 2009
- SII NANO TECHNOLOGY INC.
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe...
- Publication number 20090000365
- Publication date Jan 1, 2009
- AOI ELECTRONICS CO., LTD.
- Tatsuya KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MANIPULATING APPARATUS
- Publication number 20080314131
- Publication date Dec 25, 2008
- SII Nano Technology, Inc.
- Masatoshi Yasutake
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Particle removing method, particle removing device, atomic force mi...
- Publication number 20080307866
- Publication date Dec 18, 2008
- AOI ELECTRONICS CO., LTD.
- Hayashi Hiroki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
- Publication number 20080295585
- Publication date Dec 4, 2008
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME
- Publication number 20080295570
- Publication date Dec 4, 2008
- SII Nano Technology, Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
HEAT FLOW FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER
- Publication number 20080187020
- Publication date Aug 7, 2008
- SII NANO TECHNOLOGY INC.
- Ryoichi Kinoshita
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...
- Publication number 20080166560
- Publication date Jul 10, 2008
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hiroyuki Akinaga
- G01 - MEASURING TESTING
Information Patent Application
Micro-machining dust removing device, micro-machining apparatus, an...
- Publication number 20080132151
- Publication date Jun 5, 2008
- National University Corporation Shizuoka University
- Futoshi Iwata
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus of measuring thin film sample and method and a...
- Publication number 20080067384
- Publication date Mar 20, 2008
- SII NANO TECHNOLOGY INC.
- Yutaka Ikku
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope Fine-Movement Mechanism and Scanning Prob...
- Publication number 20080061232
- Publication date Mar 13, 2008
- SII NANO TECHNOLOGY INC.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE DISPLACEMENT DETECTING MECHANISM AND SCAN...
- Publication number 20080048115
- Publication date Feb 28, 2008
- SII NANO TECHNOLOGY INC.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
Stage for Working, Focused Beam Working Apparatus and Focused Beam...
- Publication number 20080029492
- Publication date Feb 7, 2008
- SII NANO TECHNOLOGY INC.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-ray analysis apparatus
- Publication number 20070269004
- Publication date Nov 22, 2007
- SII NANO TECHNOLOGY INC.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
Nanogripper device having length measuring function and method for...
- Publication number 20060220659
- Publication date Oct 5, 2006
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Nanogripper device and method for detecting that a sample is grippe...
- Publication number 20060014196
- Publication date Jan 19, 2006
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Trademarklast 30 trademarks

Information Trademark
77622401 - HSFINDER
- Serial number 77622401
- Registration number 3726521
- Filing date Nov 26, 2008
- SII NanoTechnology Kabushiki Kaisha
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76610870 - PIXIET
- Serial number 76610870
- Filing date Sep 10, 2004
- SII NanoTechnology Kabushiki Kaisha
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76610871 - SII NANOTECHNOLOGY INC.
- Serial number 76610871
- Filing date Sep 10, 2004
- SII NanoTechnology Kabushiki Kaisha
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76592824 - SIINT
- Serial number 76592824
- Filing date May 14, 2004
- SII NanoTechnology Kabushiki Kaisha
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Sii Nano Technology Inc.

Organization

Patents Grantslast 30 patents

Transmission X-ray analyzer and transmission X-ray analysis method

X-ray analyzer and X-ray analysis method

Displacement detection mechanism and scanning probe microscope usin...

Focused ion beam apparatus

Method of manufacturing sample for atom probe analysis by FIB and f...

Cantilever, cantilever system, and probe microscope and adsorption...

Thermal analyzer

Cross section processing method and method of manufacturing cross s...

X-ray analyzer and mapping method for an X-ray analysis

Charged particle beam apparatus and method of adjusting charged par...

Electron microscope and specimen analyzing method

Composite charged particle beam apparatus and sample processing and...

Method of measuring vibration characteristics of cantilever

X-ray fluorescence analyzer and X-ray fluorescence analysis method

Softening point measuring apparatus and thermal conductivity measur...

Stage for working, focused beam working apparatus and focused beam...

Friction force microscope

X-ray transmission inspection apparatus and x-ray transmission insp...

Cantilever for scanning probe microscope and scanning probe microsc...

Focused ion beam system and sample processing method using the same

Method of determining a spring constant of a cantilever and scannin...

X-ray analyzer

Method and apparatus for cross-section processing and observation

Charged particle beam apparatus

Focused ion beam apparatus

Differential scanning calorimeter

Probe aligning method for probe microscope and probe microscope ope...

Defect repair apparatus and method for EUV mask using a hydrogen io...

X-ray inspection device and X-ray inspection method

X-ray analysis apparatus and X-ray analysis method

Patents Applicationslast 30 patents

PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR PREPARING LAMELLA

CHARGED-PARTICLE BEAM APPARATUS

AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe...

SAMPLE MANIPULATING APPARATUS

Particle removing method, particle removing device, atomic force mi...

Tweezer-Equipped Scanning Probe Microscope and Transfer Method

POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME

HEAT FLOW FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER

PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...

Micro-machining dust removing device, micro-machining apparatus, an...

Method and apparatus of measuring thin film sample and method and a...

Scanning Probe Microscope Fine-Movement Mechanism and Scanning Prob...

SCANNING PROBE MICROSCOPE DISPLACEMENT DETECTING MECHANISM AND SCAN...

Stage for Working, Focused Beam Working Apparatus and Focused Beam...

Fluorescent X-ray analysis apparatus

Nanogripper device having length measuring function and method for...

Probe for a scanning microscope

Nanogripper device and method for detecting that a sample is grippe...

Trademarklast 30 trademarks

77622401 - HSFINDER

76610870 - PIXIET

76610871 - SII NANOTECHNOLOGY INC.

76592824 - SIINT