SILICON TEST SYSTEMS, INC.

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
High voltage, high frequency, high reliability, high density, high...
- Patent number 7,348,791
- Issue date Mar 25, 2008
- Silicon Test System, Inc.
- Romi O. Mayder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTER ON A PROBE CARD
- Publication number 20080265927
- Publication date Oct 30, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE, HIGH PARALLELISM, HIGH TEMPERATURE MEMORY TEST SYST...
- Publication number 20080191683
- Publication date Aug 14, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
SOLID HIGH ASPECT RATIO VIA HOLE USED FOR BURN-IN BOARDS, WAFER SOR...
- Publication number 20080100291
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL PRINTED CIRCUIT BOARD FOR USE WITH ELECTRONIC CIR...
- Publication number 20080099232
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LOW COST, HIGH PIN COUNT, WAFER SORT AUTOMATED TEST EQUIPMENT (ATE)...
- Publication number 20080100323
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING

Trademarklast 30 trademarks