SINO IC TECHNOLOGY CO., LTD.

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Patents Grantslast 30 patents

Information Patent Grant
Universal semiconductor-based automatic highspeed serial signal tes...
- Patent number 11,336,554
- Issue date May 17, 2022
- Sino IC Technology Co., Ltd.
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
IC test information management system based on industrial internet
- Patent number 11,042,680
- Issue date Jun 22, 2021
- Sino IC Technology Co., Ltd.
- Bin Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Halo test method for an optical chip in an integrated circuit
- Patent number 10,977,469
- Issue date Apr 13, 2021
- Sino IC Technology Co., Ltd.
- Hua Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Configuration and testing method and system for FPGA chip using bum...
- Patent number 10,613,145
- Issue date Apr 7, 2020
- SINO IC TECHNOLOGY CO., LTD.
- Bin Luo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with physical separation feature
- Patent number 8,878,545
- Issue date Nov 4, 2014
- Sino IC Technology Co., Ltd.
- Jie Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...
- Publication number 20230080214
- Publication date Mar 16, 2023
- SINO IC TECHNOLOGY CO., LTD.
- Kun YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURATION AND TESTING METHOD AND SYSTEM FOR FPGA CHIP USING BUM...
- Publication number 20180024194
- Publication date Jan 25, 2018
- SINO IC TECHNOLOGY CO., LTD.
- Bin LUO
- G01 - MEASURING TESTING
Information Patent Application
IEEE 1149.1 STANDARD BASED TESTING METHODS USED IN PACKAGING
- Publication number 20160223612
- Publication date Aug 4, 2016
- SINO IC TECHNOLOGY CO., LTD.
- Shouyin YE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COMPRESSING TEST FILE
- Publication number 20140114935
- Publication date Apr 24, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Hui Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE
- Publication number 20140070816
- Publication date Mar 13, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Jie Zhang
- G01 - MEASURING TESTING

Trademarklast 30 trademarks