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Siprosys, Inc.
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Non-contact method and apparatus for on-line interconnect character...
Patent number
7,088,121
Issue date
Aug 8, 2006
Siprosys, Inc.
Narain D. Arora
G01 - MEASURING TESTING
NSF Awards
last 12 months
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Count: 1
NSF Awards
Information
NSF Award
SBIR Phase I: Test System for Non-Contact Electrical Characterizati...
Award Id
0539160
Effective date
Jan 1, 2006