SiScan Systems, Inc.

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Campbell, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring the dimensions of patterned feat...
- Patent number 5,184,021
- Issue date Feb 2, 1993
- SiScan Systems, Inc.
- Ian R. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for reading or measuring magneto-optical stora...
- Patent number 4,847,823
- Issue date Jul 11, 1989
- SiScan Systems, Inc.
- James T. Lindow
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and aparatus for determining surface profiles
- Patent number 4,748,335
- Issue date May 31, 1988
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS
Information Patent Grant
Confocal optical imaging system with improved signal-to-noise ratio
- Patent number RE32660
- Issue date May 3, 1988
- SiScan Systems, Inc.
- James T. Lindow
- 250 - Radiant energy
Information Patent Grant
Method and apparatus for measuring surface profiles
- Patent number 4,707,610
- Issue date Nov 17, 1987
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS
Information Patent Grant
Confocal optical imaging system with improved signal-to-noise ratio
- Patent number 4,634,880
- Issue date Jan 6, 1987
- SiScan Systems, Inc.
- James T. Lindow
- G02 - OPTICS

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Trademarklast 30 trademarks

Information Trademark
73739363 - SISCAN
- Serial number 73739363
- Registration number 1526672
- Filing date Jul 8, 1988
- SISCAN SYSTEMS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments