SNU Precision Co., Ltd.

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional shape measuring device capable of measuring color...
- Patent number 9,696,144
- Issue date Jul 4, 2017
- SNU PRECISION CO., LTD.
- Tae Yong Jo
- G01 - MEASURING TESTING
Information Patent Grant
Image processing method and image processing apparatus using time a...
- Patent number 9,148,549
- Issue date Sep 29, 2015
- SNU PRECISION CO., LTD.
- Chang Kue Lim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device for supporting substrate and examiner for seal pattern of LC...
- Patent number 9,046,716
- Issue date Jun 2, 2015
- SNU Precision Co. Ltd.
- Hyoung Bae Lee
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Estimating thickness based on number of peaks between two peaks in...
- Patent number 8,947,673
- Issue date Feb 3, 2015
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for TSV measurement and measurement method using same
- Patent number 8,873,067
- Issue date Oct 28, 2014
- SNU Precision Co., Ltd.
- Ki Hun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Plasma monitoring device and method
- Patent number 8,416,293
- Issue date Apr 9, 2013
- SNU Precision Co. Ltd.
- Heung Hyun Shin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for measuring thickness
- Patent number 8,279,447
- Issue date Oct 2, 2012
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field examination device
- Patent number 8,223,326
- Issue date Jul 17, 2012
- SNU Precision Co., Ltd.
- Tai-Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring thickness
- Patent number 8,199,332
- Issue date Jun 12, 2012
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Vision inspection system and method for inspecting workpiece using...
- Patent number 8,116,555
- Issue date Feb 14, 2012
- SNU Precision Co., Ltd.
- Woo Jung Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting input shaft of power steering system
- Patent number 7,308,130
- Issue date Dec 11, 2007
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring three-dimensional volumetric errors in mult...
- Patent number 6,269,544
- Issue date Aug 7, 2001
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and compensation system for thermal errors in machine t...
- Patent number 6,167,634
- Issue date Jan 2, 2001
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of assessing three dimensional volumetric errors in multiaxi...
- Patent number 5,841,668
- Issue date Nov 24, 1998
- Snu Precision Co., Ltd.
- Heui Jae Pahk
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Three-Dimensional Shape Measuring Device Capable of Measuring Color...
- Publication number 20160102970
- Publication date Apr 14, 2016
- SNU Precision Co., Ltd.
- Tae Yong Jo
- G01 - MEASURING TESTING
Information Patent Application
Substrate Processing System with a Damage Preventing Function
- Publication number 20150129420
- Publication date May 14, 2015
- SNU Precision Co., Ltd.
- Sang Hyun Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM DEPOSITION APPARATUS
- Publication number 20140144383
- Publication date May 29, 2014
- SNU Precision Co., Ltd.
- Doo Won Kong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS USING TIME A...
- Publication number 20140085454
- Publication date Mar 27, 2014
- UMECHA CO., LTD.
- Chang Kue LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interferometer for TSV Measurement and Measurement Method Using Same
- Publication number 20140036273
- Publication date Feb 6, 2014
- SNU PRECISION CO. LTD.
- Ki Hun Lee
- G01 - MEASURING TESTING
Information Patent Application
Source Material Supplying Unit For Thin Film Depositing Apparatus
- Publication number 20130161416
- Publication date Jun 27, 2013
- SNU Precision Co., Ltd.
- Doo Won Kong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Vaporization Apparatus and Method for Controlling the Same
- Publication number 20130011804
- Publication date Jan 10, 2013
- SNU Precision Co., Ltd.
- Seung Cheol Seo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SOURCE SUPPLYING UNIT, METHOD FOR SUPPLYING SOURCE, AND THIN FILM D...
- Publication number 20120090546
- Publication date Apr 19, 2012
- SNU Precision Co., Ltd.
- Kyung Bin Bae
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus for Measuring Three-Dimensional Profile Using LCD
- Publication number 20110279670
- Publication date Nov 17, 2011
- SNU Precision Co., Ltd.
- Heui-Jae Park
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Thickness or Surface Profile
- Publication number 20110188048
- Publication date Aug 4, 2011
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
Dark-Field Examination Device
- Publication number 20110043794
- Publication date Feb 24, 2011
- SNU Precision Co., Ltd.
- Tai-Wook Kim
- G02 - OPTICS
Information Patent Application
VISION INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME
- Publication number 20110013015
- Publication date Jan 20, 2011
- SNU Precision Co., Ltd.
- Heui Jae Park
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Measuring Thickness
- Publication number 20110001988
- Publication date Jan 6, 2011
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Thickness
- Publication number 20100277745
- Publication date Nov 4, 2010
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
PLASMA MONITORING DEVICE AND METHOD
- Publication number 20100149326
- Publication date Jun 17, 2010
- SNU PRECISION CO. LTD.
- Heung Hyun Shin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF
- Publication number 20100029019
- Publication date Feb 4, 2010
- SNU PRECISION CO. LTD.
- Heui Jae PARK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROCESSING MATERIALS BY LASER BEAM
- Publication number 20100006549
- Publication date Jan 14, 2010
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE FOR SUPPORTING SUBSTRATE AND EXAMINER FOR SEAL PATTERN OF LC...
- Publication number 20090318051
- Publication date Dec 24, 2009
- SNU PRECISION CO. LTD.
- Hyoung Bae Lee
- G02 - OPTICS
Information Patent Application
VISION INSPECTION SYSTEM AND METHOD FOR INSPECTING WORKPIECE USING...
- Publication number 20090087080
- Publication date Apr 2, 2009
- SNU Precision Co., Ltd.
- Woo Jung Ahn
- G01 - MEASURING TESTING

SNU Precision Co., Ltd.

Organization

Patents Grantslast 30 patents

Three-dimensional shape measuring device capable of measuring color...

Image processing method and image processing apparatus using time a...

Device for supporting substrate and examiner for seal pattern of LC...

Estimating thickness based on number of peaks between two peaks in...

Interferometer for TSV measurement and measurement method using same

Plasma monitoring device and method

Method for measuring thickness

Dark-field examination device

Apparatus for measuring thickness

Vision inspection system and method for inspecting workpiece using...

Method for inspecting input shaft of power steering system

Apparatus for measuring three-dimensional volumetric errors in mult...

Measurement and compensation system for thermal errors in machine t...

Method of assessing three dimensional volumetric errors in multiaxi...

Patents Applicationslast 30 patents

Three-Dimensional Shape Measuring Device Capable of Measuring Color...

Substrate Processing System with a Damage Preventing Function

VACUUM DEPOSITION APPARATUS

IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS USING TIME A...

Interferometer for TSV Measurement and Measurement Method Using Same

Source Material Supplying Unit For Thin Film Depositing Apparatus

Vaporization Apparatus and Method for Controlling the Same

SOURCE SUPPLYING UNIT, METHOD FOR SUPPLYING SOURCE, AND THIN FILM D...

Apparatus for Measuring Three-Dimensional Profile Using LCD

Method for Measuring Thickness or Surface Profile

Dark-Field Examination Device

VISION INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

Apparatus for Measuring Thickness

Method for Measuring Thickness

PLASMA MONITORING DEVICE AND METHOD

DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF

DEVICE FOR PROCESSING MATERIALS BY LASER BEAM

DEVICE FOR SUPPORTING SUBSTRATE AND EXAMINER FOR SEAL PATTERN OF LC...

VISION INSPECTION SYSTEM AND METHOD FOR INSPECTING WORKPIECE USING...

Trademarklast 30 trademarks