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Sof-Tek Integrators, Inc.
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Redding, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for characterizing light emitting devices
Patent number
9,551,669
Issue date
Jan 24, 2017
Sof-Tek Integrators, Inc.
Daniel C. Morrow
G01 - MEASURING TESTING
Information
Patent Grant
System and method of testing high brightness LED (HBLED)
Patent number
9,442,155
Issue date
Sep 13, 2016
Sof-Tek Integrators, Inc.
Daniel Creighton Morrow
G01 - MEASURING TESTING
Information
Patent Grant
System and method of quantifying color and intensity of light sources
Patent number
9,279,725
Issue date
Mar 8, 2016
Sof-Tek Integrators, Inc.
Daniel Creighton Morrow
G01 - MEASURING TESTING
Information
Patent Grant
System and method of quantifying color and intensity of light sources
Patent number
9,128,144
Issue date
Sep 8, 2015
Sof-Tek Integrators, Inc.
Daniel Creighton Morrow
G01 - MEASURING TESTING
Information
Patent Grant
System and method of testing high brightness LED (HBLED)
Patent number
8,593,148
Issue date
Nov 26, 2013
Sof-Tek Integrators, Inc.
Daniel Creighton Morrow
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD OF QUANTIFYING COLOR AND INTENSITY OF LIGHT SOURCES
Publication number
20150355028
Publication date
Dec 10, 2015
Sof-Tek Integrators, Inc. dba Op-Test
Daniel Creighton Morrow
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING LIGHT EMITTING DEVICES
Publication number
20140268152
Publication date
Sep 18, 2014
Sof-Tek Integrators, Inc. dba as Op-Test
Daniel C. MORROW
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF TESTING HIGH BRIGHTNESS LED (HBLED)
Publication number
20140088910
Publication date
Mar 27, 2014
Sof-Tek Integrators, Inc. dba Op-Test
Daniel Creighton Morrow
G01 - MEASURING TESTING
Information
Patent Application
System and Method of Quantifying Color and Intensity of Light Sources
Publication number
20120038363
Publication date
Feb 16, 2012
Sof-Tek Integrators, Inc. dba Op-Test
Daniel Creighton Morrow
G01 - MEASURING TESTING