SOLID STATE MEASUREMENTS, INC., A PA CORP

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MONREOVILLE, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for measurement of sidewall damage in etched diel...
- Patent number 7,362,108
- Issue date Apr 22, 2008
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Elastic metal gate MOS transistor for surface mobility measurement...
- Patent number 7,327,155
- Issue date Feb 5, 2008
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
In-situ wafer and probe desorption using closed loop heating
- Patent number 7,304,490
- Issue date Dec 4, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically determining electrical properti...
- Patent number 7,295,022
- Issue date Nov 13, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measurement of dielectric constant of thin fi...
- Patent number 7,285,963
- Issue date Oct 23, 2007
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring semiconductor wafers with an oxide enhanced probe
- Patent number 7,282,941
- Issue date Oct 16, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting un-annealed ion implants
- Patent number 7,250,313
- Issue date Jul 31, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining concentration of defects and/o...
- Patent number 7,190,186
- Issue date Mar 13, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate surface preparation using high temperature...
- Patent number 7,063,992
- Issue date Jun 20, 2006
- Solid State Measurements, Inc.
- Michael J. Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining generation lifetime of product...
- Patent number 7,037,734
- Issue date May 2, 2006
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the dielectric constant of a l...
- Patent number 7,026,837
- Issue date Apr 11, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Work function controlled probe for measuring properties of a semico...
- Patent number 7,023,231
- Issue date Apr 4, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for removing and/or preventing surface contami...
- Patent number 7,007,408
- Issue date Mar 7, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- B08 - CLEANING
Information Patent Grant
Apparatus and method for detecting soft breakdown of a dielectric l...
- Patent number 7,005,307
- Issue date Feb 28, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method of electrical characterization of a silicon-on-insulator (SO...
- Patent number 6,991,948
- Issue date Jan 31, 2006
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring semiconductor wafer electrical p...
- Patent number 6,972,582
- Issue date Dec 6, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane probe and method of use thereof
- Patent number 6,900,652
- Issue date May 31, 2005
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining electrical properties of a sem...
- Patent number 6,894,519
- Issue date May 17, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Conductance-voltage (GV) based method for determining leakage curre...
- Patent number 6,879,176
- Issue date Apr 12, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing semiconductor wafers
- Patent number 6,851,096
- Issue date Feb 1, 2005
- Solid State Measurements, Inc.
- William J. Alexander
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive electrical measurement of semiconductor wafers
- Patent number 6,842,029
- Issue date Jan 11, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Sample chuck with compound construction
- Patent number 6,803,780
- Issue date Oct 12, 2004
- Solid State Measurements, Inc.
- Michael John Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining doping concentration of a semiconductor w...
- Patent number 6,788,076
- Issue date Sep 7, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining one or more properties of a semiconductor wafer
- Patent number 6,741,093
- Issue date May 25, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
High speed threshold voltage and average surface doping measurements
- Patent number 6,657,454
- Issue date Dec 2, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining doping concentration of a semi...
- Patent number 6,632,691
- Issue date Oct 14, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive electrical measurement of semiconductor wafers
- Patent number 6,492,827
- Issue date Dec 10, 2002
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact capacitance measuring device
- Patent number 6,150,832
- Issue date Nov 21, 2000
- Solid State Measurements, Inc.
- Robert G. Mazur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spreading resistance profiling system
- Patent number 6,052,653
- Issue date Apr 18, 2000
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for characterization of electrical properties of a semico...
- Patent number 5,036,271
- Issue date Jul 30, 1991
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of destructive testing the dielectric layer of a semiconduct...
- Publication number 20080290889
- Publication date Nov 27, 2008
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method for determining the electrically active dopant density profi...
- Publication number 20070249073
- Publication date Oct 25, 2007
- Solid State Measurement, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Elastic metal gate MOS transistor for surface mobility measurement...
- Publication number 20070109007
- Publication date May 17, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method and system for automatically determining electrical properti...
- Publication number 20070046310
- Publication date Mar 1, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring semiconductor wafers with an oxide enhanced probe
- Publication number 20060219658
- Publication date Oct 5, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
In-situ wafer and probe desorption using closed loop heating
- Publication number 20060097740
- Publication date May 11, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining concentration of defects and/o...
- Publication number 20060066323
- Publication date Mar 30, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting un-annealed ion implants
- Publication number 20060068514
- Publication date Mar 30, 2006
- Solid State Measurements, Inc.
- William H. Howland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for determining generation lifetime of product...
- Publication number 20050287683
- Publication date Dec 29, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...
- Publication number 20050287684
- Publication date Dec 29, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Work function controlled probe for measuring properties of a semico...
- Publication number 20050253618
- Publication date Nov 17, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for removing and/or preventing surface contami...
- Publication number 20050241175
- Publication date Nov 3, 2005
- Solid State Measurements, Inc.
- William H. Howland
- B08 - CLEANING
Information Patent Application
Method of testing semiconductor wafers with non-penetrating probes
- Publication number 20050225345
- Publication date Oct 13, 2005
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining the dielectric constant of a l...
- Publication number 20050146348
- Publication date Jul 7, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of electrical characterization of a silicon-on-insulator ( S...
- Publication number 20050095728
- Publication date May 5, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTANCE-VOLTAGE (GV) BASED METHOD FOR DETERMINING LEAKAGE CURRE...
- Publication number 20050093563
- Publication date May 5, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate surface preparation using high temperature...
- Publication number 20050028836
- Publication date Feb 10, 2005
- Solid State Measurements, Inc.
- Michael J. Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE MEMBRANE PROBE AND METHOD OF USE THEREOF
- Publication number 20040251923
- Publication date Dec 16, 2004
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring semiconductor wafer electrical p...
- Publication number 20040155240
- Publication date Aug 12, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Non-invasive electrical measurement of semiconductor wafers
- Publication number 20030227292
- Publication date Dec 11, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining electrical properties of a sem...
- Publication number 20030210066
- Publication date Nov 13, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing semiconductor wafers
- Publication number 20030071631
- Publication date Apr 17, 2003
- Solid State Measurements, Inc.
- William J. Alexander
- G01 - MEASURING TESTING
Information Patent Application
Sample chuck with compound construction
- Publication number 20030011392
- Publication date Jan 16, 2003
- Solid State Measurements, Inc.
- Michael John Adams
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
77314171 - NEOMETRIK
- Serial number 77314171
- Registration number 3558650
- Filing date Oct 26, 2007
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76132779 - FASTGUARD
- Serial number 76132779
- Filing date Sep 21, 2000
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76091102 - FASTGATE
- Serial number 76091102
- Registration number 2664042
- Filing date Jul 18, 2000
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76074798 - NANOCV
- Serial number 76074798
- Filing date Jun 20, 2000
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75501606 - NANOGAP
- Serial number 75501606
- Filing date Jun 12, 1998
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74604529 - SSM
- Serial number 74604529
- Registration number 1938487
- Filing date Nov 30, 1994
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74515760 - NANOSRP
- Serial number 74515760
- Registration number 2192446
- Filing date Apr 8, 1994
- SOLID STATE MEASUREMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

SOLID STATE MEASUREMENTS, INC., A PA CORP

Organization

Patents Grantslast 30 patents

Method and system for measurement of sidewall damage in etched diel...

Elastic metal gate MOS transistor for surface mobility measurement...

In-situ wafer and probe desorption using closed loop heating

Method and system for automatically determining electrical properti...

Method and system for measurement of dielectric constant of thin fi...

Method of measuring semiconductor wafers with an oxide enhanced probe

Method of detecting un-annealed ion implants

Method and apparatus for determining concentration of defects and/o...

Semiconductor substrate surface preparation using high temperature...

Method and apparatus for determining generation lifetime of product...

Method and apparatus for determining the dielectric constant of a l...

Work function controlled probe for measuring properties of a semico...

Method and apparatus for removing and/or preventing surface contami...

Apparatus and method for detecting soft breakdown of a dielectric l...

Method of electrical characterization of a silicon-on-insulator (SO...

Apparatus and method for measuring semiconductor wafer electrical p...

Flexible membrane probe and method of use thereof

Apparatus and method for determining electrical properties of a sem...

Conductance-voltage (GV) based method for determining leakage curre...

Method and apparatus for testing semiconductor wafers

Non-invasive electrical measurement of semiconductor wafers

Sample chuck with compound construction

Apparatus for determining doping concentration of a semiconductor w...

Method of determining one or more properties of a semiconductor wafer

High speed threshold voltage and average surface doping measurements

Apparatus and method for determining doping concentration of a semi...

Non-invasive electrical measurement of semiconductor wafers

Noncontact capacitance measuring device

Spreading resistance profiling system

Apparatus for characterization of electrical properties of a semico...

Patents Applicationslast 30 patents

Method of destructive testing the dielectric layer of a semiconduct...

Method for determining the electrically active dopant density profi...

Elastic metal gate MOS transistor for surface mobility measurement...

Method and system for automatically determining electrical properti...

Method of measuring semiconductor wafers with an oxide enhanced probe

In-situ wafer and probe desorption using closed loop heating

Method and apparatus for determining concentration of defects and/o...

Method of detecting un-annealed ion implants

Method and apparatus for determining generation lifetime of product...

APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...

Work function controlled probe for measuring properties of a semico...

Method and apparatus for removing and/or preventing surface contami...

Method of testing semiconductor wafers with non-penetrating probes

Method and apparatus for determining the dielectric constant of a l...

Method of electrical characterization of a silicon-on-insulator ( S...

CONDUCTANCE-VOLTAGE (GV) BASED METHOD FOR DETERMINING LEAKAGE CURRE...

Semiconductor substrate surface preparation using high temperature...

FLEXIBLE MEMBRANE PROBE AND METHOD OF USE THEREOF

Apparatus and method for measuring semiconductor wafer electrical p...

Non-invasive electrical measurement of semiconductor wafers

Apparatus and method for determining electrical properties of a sem...

Method and apparatus for testing semiconductor wafers

Sample chuck with compound construction

Trademarklast 30 trademarks

77314171 - NEOMETRIK

76132779 - FASTGUARD

76091102 - FASTGATE

76074798 - NANOCV

75501606 - NANOGAP

74604529 - SSM

74515760 - NANOSRP