Soshotech Co., Ltd.

Organization

Kanagawa-Ken, JP

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting display board or circuit board
- Patent number 6,590,406
- Issue date Jul 8, 2003
- Soshotech Co., Ltd.
- Toshio Okuno
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Unit with inspection probe blocks mounted thereon in parallel
- Patent number 6,577,145
- Issue date Jun 10, 2003
- Soshotech Co., Ltd.
- Toshio Okuno
- G01 - MEASURING TESTING
Information Patent Grant
Supporting framework for display panel or probe block
- Patent number 6,556,004
- Issue date Apr 29, 2003
- Soshotech Co., Ltd.
- Toshio Okuno
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Flat panel display or probe block support framework
- Patent number 6,450,469
- Issue date Sep 17, 2002
- Soshotech Co., Ltd.
- Toshio Okuno
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Contact structure of lead
- Patent number 6,398,561
- Issue date Jun 4, 2002
- Soshotech Co., Ltd.
- Toshio Okuno
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit
- Patent number 6,211,691
- Issue date Apr 3, 2001
- Soshotech Co., Ltd.
- Toshio Okuno
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Contact probe
- Patent number 6,181,150
- Issue date Jan 30, 2001
- Soshotech Co., Ltd.
- Toshio Okuno
- G01 - MEASURING TESTING
Information Patent Grant
Method for building and a structure of a contact end in a contact p...
- Patent number 6,111,418
- Issue date Aug 29, 2000
- Soshotech Co., Ltd.
- Toshio Okuno
- G01 - MEASURING TESTING

Soshotech Co., Ltd.

Organization

Patents Grantslast 30 patents

Apparatus for inspecting display board or circuit board

Unit with inspection probe blocks mounted thereon in parallel

Supporting framework for display panel or probe block

Flat panel display or probe block support framework

Contact structure of lead

Probe unit

Contact probe

Method for building and a structure of a contact end in a contact p...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks