Spin Diagnostics, Inc.

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Organization

Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
High throughput imaging device and method
- Patent number 7,355,698
- Issue date Apr 8, 2008
- Spin Diagnostics, Inc.
- Shishir Shah
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
High Throughput Imaging Device and Method
- Publication number 20060238765
- Publication date Oct 26, 2006
- Spin Diagnostics, Inc.
- Shishir Shah
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
78166154 - SPIN CYTOMETER
- Serial number 78166154
- Filing date Sep 20, 2002
- Spin Diagnostics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments