Spire Manufacturing Inc.

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Interface apparatus for semiconductor testing
- Patent number 11,085,950
- Issue date Aug 10, 2021
- Spire Manufacturing
- Hai Dau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface apparatus for semiconductor testing and method of manufac...
- Patent number 10,096,958
- Issue date Oct 9, 2018
- Spire Manufacturing Inc.
- Hai Dau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-die interface for semiconductor testing and method of manufac...
- Patent number 9,933,479
- Issue date Apr 3, 2018
- Spire Manufacturing
- Hai Dau
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Temperature- Low Leakage Probe Apparatus and Method
- Publication number 20210199695
- Publication date Jul 1, 2021
- Spire Manufacturing Inc.
- Hai Dau
- G01 - MEASURING TESTING

Trademarklast 30 trademarks