Staib Instruments GmbH

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Patents Grantslast 30 patents

Information Patent Grant
Electron diffraction system for use in production environment and f...
- Patent number 6,841,777
- Issue date Jan 11, 2005
- Staib Instruments GmbH
- Philippe Staib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for imaging a particle beam
- Patent number 6,198,095
- Issue date Mar 6, 2001
- Staib Instruments GmbH
- Philippe Staib
- H01 - BASIC ELECTRIC ELEMENTS

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