Star Technologies Inc.

Organization

Hsin Chu Hsien, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Switching matrix system and operating method thereof for semiconduc...
- Patent number 11,953,518
- Issue date Apr 9, 2024
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and jumper thereof
- Patent number 11,828,789
- Issue date Nov 28, 2023
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus with temperature-adjusting mechanism
- Patent number 11,754,619
- Issue date Sep 12, 2023
- Star Technologies, Inc.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probing apparatus and method of operating the same
- Patent number 11,307,246
- Issue date Apr 19, 2022
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing and analyzing display panel
- Patent number 11,217,649
- Issue date Jan 4, 2022
- Star Technologies, Inc.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus
- Patent number 11,209,462
- Issue date Dec 28, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating a probing apparatus
- Patent number 11,054,465
- Issue date Jul 6, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probing device
- Patent number 11,047,880
- Issue date Jun 29, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a junction temperature of a device under tes...
- Patent number 10,890,614
- Issue date Jan 12, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus, holding assembly, and probe card carrier
- Patent number 10,184,957
- Issue date Jan 22, 2019
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Test assembly and method of manufacturing the same
- Patent number 10,088,502
- Issue date Oct 2, 2018
- Star Technologies, Inc.
- Ho Yeh Chen
- G01 - MEASURING TESTING
Information Patent Grant
Switching matrix and testing system for semiconductor characteristi...
- Patent number 9,885,746
- Issue date Feb 6, 2018
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Test assembly
- Patent number 9,739,830
- Issue date Aug 22, 2017
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Testing device
- Patent number 9,535,114
- Issue date Jan 3, 2017
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
High-precision semiconductor device probing apparatus and system th...
- Patent number 9,329,205
- Issue date May 3, 2016
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus for semiconductor devices
- Patent number 8,988,092
- Issue date Mar 24, 2015
- Star Technologies Inc.
- Chen Jung Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing high-frequency signals
- Patent number 8,692,570
- Issue date Apr 8, 2014
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for light-emitting devices with a design for a re...
- Patent number 8,389,926
- Issue date Mar 5, 2013
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method for configuring combinational switching matrix and testing s...
- Patent number 8,310,264
- Issue date Nov 13, 2012
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus with on-probe device-mapping function
- Patent number 8,279,451
- Issue date Oct 2, 2012
- Star Technologies Inc.
- Yong Yu Liu
- G01 - MEASURING TESTING
Information Patent Grant
Heat sink and integrated circuit assembly using the same
- Patent number 8,198,725
- Issue date Jun 12, 2012
- Star Technologies Inc.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enclosed probe station
- Patent number 8,188,758
- Issue date May 29, 2012
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus with multiaxial stages for testing semiconductor...
- Patent number 8,169,227
- Issue date May 1, 2012
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices testing apparatus with temperature-adjusting...
- Patent number 8,035,405
- Issue date Oct 11, 2011
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
High speed probing apparatus for semiconductor devices and probe st...
- Patent number 7,986,157
- Issue date Jul 26, 2011
- Star Technologies Inc.
- Yong Yu Liu
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe comprising slots and probe card for integrated circu...
- Patent number 7,928,749
- Issue date Apr 19, 2011
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature probing apparatus
- Patent number 7,791,363
- Issue date Sep 7, 2010
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Heating apparatus for semiconductor devices
- Patent number 7,675,307
- Issue date Mar 9, 2010
- Star Technologies Inc.
- Choon Leong Lou
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Grant
Integrated circuit probing apparatus having a temperature-adjusting...
- Patent number 7,616,018
- Issue date Nov 10, 2009
- Star Technologies Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probing apparatus having a temperature-adjusting...
- Patent number 7,576,553
- Issue date Aug 18, 2009
- Star Technologies Inc.
- Choon-Leong Lou
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD FOR HIGH-FREQUENCY TESTING
- Publication number 20240168057
- Publication date May 23, 2024
- STAR TECHNOLOGIES, INC.
- HUNG-CHUN HUANG
- G01 - MEASURING TESTING
Information Patent Application
SWITCH PROTECTION SYSTEM AND SWITCH PROTECTION METHOD
- Publication number 20240171172
- Publication date May 23, 2024
- STAR TECHNOLOGIES, INC.
- LI-MIN WANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROBE ARRAY AND PROBE STRUCTURE
- Publication number 20240053381
- Publication date Feb 15, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE STRUCTURE AND PROBE ARRAY
- Publication number 20240036106
- Publication date Feb 1, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...
- Publication number 20230400480
- Publication date Dec 14, 2023
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND JUMPER THEREOF
- Publication number 20230123340
- Publication date Apr 20, 2023
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS WITH TEMPERATURE-ADJUSTING MECHANISM
- Publication number 20220221508
- Publication date Jul 14, 2022
- STAR TECHNOLOGIES, INC.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING MATRIX SYSTEM AND OPERATING METHOD THEREOF FOR SEMICONDUC...
- Publication number 20220206040
- Publication date Jun 30, 2022
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND METHOD OF ASSEMBLING THE SAME
- Publication number 20220178969
- Publication date Jun 9, 2022
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING AND MANUFACTURING DISPLAY PANEL
- Publication number 20210313408
- Publication date Oct 7, 2021
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PROBING APPARATUS
- Publication number 20210116496
- Publication date Apr 22, 2021
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS AND METHOD OF OPERATING THE SAME
- Publication number 20210088581
- Publication date Mar 25, 2021
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A JUNCTION TEMPERATURE OF A DEVICE UNDER TES...
- Publication number 20200326366
- Publication date Oct 15, 2020
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBING DEVICE
- Publication number 20200225266
- Publication date Jul 16, 2020
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
TEST ASSEMBLY AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160252548
- Publication date Sep 1, 2016
- STAR TECHNOLOGIES, INC.
- Ho Yeh CHEN
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE CARD
- Publication number 20150109016
- Publication date Apr 23, 2015
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G02 - OPTICS
Information Patent Application
TEST ASSEMBLY
- Publication number 20140340108
- Publication date Nov 20, 2014
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
TEST ASSEMBLY
- Publication number 20140340105
- Publication date Nov 20, 2014
- STAR TECHNOLOGIES, INC.
- Choon Leong LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE
- Publication number 20140145740
- Publication date May 29, 2014
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PRECISION SEMICONDUCTOR DEVICE PROBING APPARATUS AND SYSTEM TH...
- Publication number 20130249584
- Publication date Sep 26, 2013
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR PERFORMING AVALANCHE TEST
- Publication number 20130229199
- Publication date Sep 5, 2013
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR PERFORMING AN AVALANCHE TEST AND METHOD THEREOF
- Publication number 20130229200
- Publication date Sep 5, 2013
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING MATRIX AND TESTING SYSTEM FOR SEMICONDUCTOR CHARACTERISTI...
- Publication number 20130082731
- Publication date Apr 4, 2013
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY CIRCUIT BOARD
- Publication number 20130048344
- Publication date Feb 28, 2013
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBING APPARATUS FOR SEMICONDUCTOR DEVICES
- Publication number 20130027072
- Publication date Jan 31, 2013
- STAR TECHNOLOGIES INC.
- CHEN JUNG HSU
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION SYSTEM OF ELECTRONIC DEVICES
- Publication number 20130030766
- Publication date Jan 31, 2013
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Probe Card for Testing Semiconductor Devices and Vertical Probe The...
- Publication number 20120043987
- Publication date Feb 23, 2012
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Probing Apparatus with On-Probe Device-Mapping Function
- Publication number 20110304857
- Publication date Dec 15, 2011
- STAR TECHNOLOGIES INC.
- Yong Yu Liu
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR TESTING HIGH-FREQUENCY SIGNALS
- Publication number 20110279139
- Publication date Nov 17, 2011
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
HEAT SINK AND INTEGRATED CIRCUIT ASSEMBLY USING THE SAME
- Publication number 20110156244
- Publication date Jun 30, 2011
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- H01 - BASIC ELECTRIC ELEMENTS

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Trademarklast 30 trademarks

Information Trademark
97864991 - POWOS
- Serial number 97864991
- Filing date Mar 30, 2023
- STAR TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471685 - ST-100
- Serial number 73471685
- Registration number 1320499
- Filing date Mar 22, 1984
- STAR TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471532 - STAR TECHNOLOGIES
- Serial number 73471532
- Filing date Mar 22, 1984
- STAR TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471690 - STAR TECHNOLOGIES
- Serial number 73471690
- Filing date Mar 22, 1984
- STAR TECHNOLOGIES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Star Technologies Inc.

Organization

Patents Grantslast 30 patents

Switching matrix system and operating method thereof for semiconduc...

Test apparatus and jumper thereof

Probing apparatus with temperature-adjusting mechanism

Probing apparatus and method of operating the same

Method of testing and analyzing display panel

Testing apparatus

Method of operating a probing apparatus

Probing device

Method for determining a junction temperature of a device under tes...

Testing apparatus, holding assembly, and probe card carrier

Test assembly and method of manufacturing the same

Switching matrix and testing system for semiconductor characteristi...

Test assembly

Testing device

High-precision semiconductor device probing apparatus and system th...

Probing apparatus for semiconductor devices

Probe card for testing high-frequency signals

Testing apparatus for light-emitting devices with a design for a re...

Method for configuring combinational switching matrix and testing s...

Probing apparatus with on-probe device-mapping function

Heat sink and integrated circuit assembly using the same

Enclosed probe station

Probing apparatus with multiaxial stages for testing semiconductor...

Semiconductor devices testing apparatus with temperature-adjusting...

High speed probing apparatus for semiconductor devices and probe st...

Vertical probe comprising slots and probe card for integrated circu...

Low temperature probing apparatus

Heating apparatus for semiconductor devices

Integrated circuit probing apparatus having a temperature-adjusting...

Integrated circuit probing apparatus having a temperature-adjusting...

Patents Applicationslast 30 patents

PROBE CARD FOR HIGH-FREQUENCY TESTING

SWITCH PROTECTION SYSTEM AND SWITCH PROTECTION METHOD

PROBE ARRAY AND PROBE STRUCTURE

GUIDE PLATE STRUCTURE AND PROBE ARRAY

PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...

TEST APPARATUS AND JUMPER THEREOF

PROBING APPARATUS WITH TEMPERATURE-ADJUSTING MECHANISM

SWITCHING MATRIX SYSTEM AND OPERATING METHOD THEREOF FOR SEMICONDUC...

PROBE DEVICE AND METHOD OF ASSEMBLING THE SAME

METHOD OF ANALYZING AND MANUFACTURING DISPLAY PANEL

METHOD OF OPERATING A PROBING APPARATUS

PROBING APPARATUS AND METHOD OF OPERATING THE SAME

METHOD FOR DETERMINING A JUNCTION TEMPERATURE OF A DEVICE UNDER TES...

PROBING DEVICE

TEST ASSEMBLY AND METHOD OF MANUFACTURING THE SAME

TEST PROBE CARD

TEST ASSEMBLY

TEST ASSEMBLY

TESTING DEVICE

HIGH-PRECISION SEMICONDUCTOR DEVICE PROBING APPARATUS AND SYSTEM TH...

TESTING APPARATUS FOR PERFORMING AVALANCHE TEST

TESTING APPARATUS FOR PERFORMING AN AVALANCHE TEST AND METHOD THEREOF

SWITCHING MATRIX AND TESTING SYSTEM FOR SEMICONDUCTOR CHARACTERISTI...

HIGH FREQUENCY CIRCUIT BOARD

PROBING APPARATUS FOR SEMICONDUCTOR DEVICES

CALIBRATION SYSTEM OF ELECTRONIC DEVICES

Probe Card for Testing Semiconductor Devices and Vertical Probe The...

Probing Apparatus with On-Probe Device-Mapping Function

PROBE CARD FOR TESTING HIGH-FREQUENCY SIGNALS

HEAT SINK AND INTEGRATED CIRCUIT ASSEMBLY USING THE SAME

Trademarklast 30 trademarks

97864991 - POWOS

73471685 - ST-100

73471532 - STAR TECHNOLOGIES

73471690 - STAR TECHNOLOGIES