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Patents Grants
last 30 patents
Information
Patent Grant
Method, system and device for radar based high resolution object de...
Patent number
10,281,575
Issue date
May 7, 2019
Steradian Semiconductors Private Limited
Gireesh Rajendran
G01 - MEASURING TESTING
Information
Patent Grant
Method, system and device for providing phase shifted signals to an...
Patent number
10,284,271
Issue date
May 7, 2019
Steradian Semiconductors Private Limited
Gireesh Rajendran
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
Low Power Integrated Circuit with an Efficient Power Combiner
Publication number
20240006736
Publication date
Jan 4, 2024
Steradian Semiconductors Private Limited
Gireesh Rajendran
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High Accuracy On-Chip Temperature Sensor System and Method Thereof
Publication number
20230296451
Publication date
Sep 21, 2023
Steradian Semiconductors Private Limited
Gireesh Rajendran
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Extending Radar Doppler Range
Publication number
20230204715
Publication date
Jun 29, 2023
Steradian Semiconductors Private Limited
Apu Sivadas
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Determining Angle of Arrival in a Radar Based...
Publication number
20230152436
Publication date
May 18, 2023
Steradian Semiconductors Private Limited
Ankit Sharma
G01 - MEASURING TESTING
Information
Patent Application
Low Noise Voltage Regulator
Publication number
20220291705
Publication date
Sep 15, 2022
Steradian Semiconductors Private Limited
Alok Prakash Joshi
G05 - CONTROLLING REGULATING
Information
Patent Application
System, Device and Method for Data Compression in a Radar System
Publication number
20220159097
Publication date
May 19, 2022
Steradian Semiconductors Private Limited
Amrith Sukumaran
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System, Device and Method for Efficient MIMO Radar
Publication number
20220099819
Publication date
Mar 31, 2022
Steradian Semiconductors Private Limited
Gireesh Rajendran
G01 - MEASURING TESTING
Information
Patent Application
METHOD, SYSTEM AND DEVICE PROVIDING ENHANCED QUALITY FACTOR RESONAN...
Publication number
20210399684
Publication date
Dec 23, 2021
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Gireesh Rajendran
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR GENERATING POINT CLOUD DATA IN A RADAR BASED...
Publication number
20210141053
Publication date
May 13, 2021
Steradian Semiconductors Private Limited
Sachin Bharadwaj
G01 - MEASURING TESTING
Information
Patent Application
Method, Apparatus and Device for Determining a Velocity of an Objec...
Publication number
20200241125
Publication date
Jul 30, 2020
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Apu Sivadas
G01 - MEASURING TESTING
Information
Patent Application
Millimeter Wave Integrated Circuit and System with a Low Loss Packa...
Publication number
20200161257
Publication date
May 21, 2020
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Apu Sivadas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method, Apparatus and Device for Doppler Compensation in a Time Swi...
Publication number
20200088867
Publication date
Mar 19, 2020
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Gireesh Rajendran
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and Device for Calibrating a Radar Object Detection System
Publication number
20190265330
Publication date
Aug 29, 2019
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Gireesh Rajendran
G01 - MEASURING TESTING
Information
Patent Application
Phase Shifter for Giga Hertz Integrated Circuits
Publication number
20190229699
Publication date
Jul 25, 2019
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Alok Prakash Joshi
G01 - MEASURING TESTING
Information
Patent Application
METHOD, SYSTEM AND DEVICE FOR RADAR BASED HIGH RESOLUTION OBJECT DE...
Publication number
20180088229
Publication date
Mar 29, 2018
STERADIAN SEMICONDUCTORS PRIVATE LIMITED
Gireesh Rajendran
G01 - MEASURING TESTING
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