Stichting Centrum Voor Micro-Electronica Twente

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Enschede, NL

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Method of producing an ISFET and same ISFET
- Patent number 4,735,702
- Issue date Apr 5, 1988
- Stichting Centrum Voor Micro-Electronica Twente
- David N. Reinhoudt
- G01 - MEASURING TESTING

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