STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN

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UTRECHT, NL

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Patents Grantslast 30 patents

Information Patent Grant
Multi-angle imager
- Patent number 11,193,823
- Issue date Dec 7, 2021
- Stichting Nederlandse Wetenschappelijk Onderzoek Instituten
- Aaldert Hidde Van Amerongen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING LEAD
- Publication number 20240183786
- Publication date Jun 6, 2024
- STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN
- Lukas HELMBRECHT
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED POLYMERIZATION OF A TARGET ZONE IN A PHOTOPOLYMERIZABLE...
- Publication number 20210394449
- Publication date Dec 23, 2021
- Stichting Nederlandse Wetenschappelijk Onderzoek Instituten
- Alexander Kostenko
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
MULTI-ANGLE IMAGER
- Publication number 20200319026
- Publication date Oct 8, 2020
- Stichting Nederlandse Wetenschappelijk Onderzoek Instituten
- Aaldert Hidde VAN AMERONGEN
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining a Characteristic of a Structure, and Metrolog...
- Publication number 20190310559
- Publication date Oct 10, 2019
- Stichting VU
- Johannes Fitzgerald DE BOER
- G01 - MEASURING TESTING
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20190265028
- Publication date Aug 29, 2019
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology System and Method For Determining a Characteristic of One...
- Publication number 20190107781
- Publication date Apr 11, 2019
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Apparatus for Predicting Performance of a Measurement M...
- Publication number 20180348145
- Publication date Dec 6, 2018
- ASML NETHERLANDS B.V.
- Stefan Michiel WITTE
- G01 - MEASURING TESTING

STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN

Organization

Patents Grantslast 30 patents

Multi-angle imager

Patents Applicationslast 30 patents

METHOD FOR DETECTING LEAD

CONTROLLED POLYMERIZATION OF A TARGET ZONE IN A PHOTOPOLYMERIZABLE...

MULTI-ANGLE IMAGER

Method of Determining a Characteristic of a Structure, and Metrolog...

Metrology Apparatus and Method for Determining a Characteristic of...

Metrology System and Method For Determining a Characteristic of One...

Methods and Apparatus for Predicting Performance of a Measurement M...

Trademarklast 30 trademarks