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STICHTING VOOR FUNDAMENTEEL ONDERZOEK DER MATERIE
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UTRECHT, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoscale optical tomography with cathodoluminescence spectroscopy
Patent number
10,551,330
Issue date
Feb 4, 2020
The Board of Trustees of the Leland Stanford Junior University
Ashwin C. Atre
G01 - MEASURING TESTING
Information
Patent Grant
Microdialysis-probe integrated with a si-chip
Patent number
6,463,312
Issue date
Oct 8, 2002
Stichting Voor Fundamenteel Onderzoek der Materie
Piet Bergveld
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus for detecting a photon pulse
Patent number
6,049,079
Issue date
Apr 11, 2000
Stichting Voor Fundamenteel Onderzoek der Materie
Lambertus Dominicus Noordam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas laser
Patent number
4,307,351
Issue date
Dec 22, 1981
Stichting voor Fundamenteel Onderzoek der Materie
Gijsbert L. Oomen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas laser system
Patent number
4,207,540
Issue date
Jun 10, 1980
Stichting Voor Fundamenteel Onderzoek der Materie
Gerardus J. Ernst
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Set-up for a transversely excited laser operating at atmospheric pr...
Patent number
4,185,255
Issue date
Jan 22, 1980
Stichting Voor Fundamenteel Onderzoek der Materie
Wilhelmus J. Witteman
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Inspection Method, Inspection Apparatus and Illumination Method and...
Publication number
20170269482
Publication date
Sep 21, 2017
Stichting VU
Dirk Ewoud Boonzajer Flaes
G01 - MEASURING TESTING
Information
Patent Application
Inspection Apparatus and Method
Publication number
20170176879
Publication date
Jun 22, 2017
Stichting VU
Stefan Michiel WITTE
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE OPTICAL TOMOGRAPHY WITH CATHODOLUMINESCENCE SPECTROSCOPY
Publication number
20170052130
Publication date
Feb 23, 2017
The Board of Trustees of the Leland Stanford Junior University
Ashwin C. Atre
G01 - MEASURING TESTING
Information
Patent Application
Inspection Apparatus, Inspection Method And Manufacturing Method
Publication number
20160061750
Publication date
Mar 3, 2016
Vrije Universiteit Amsterdam
Arie Jeffrey DEN BOEF
G01 - MEASURING TESTING
Information
Patent Application
PROCESS TO PREPARE METAL NANOPARTICLES OR METAL OXIDE NANOPARTICLES
Publication number
20130199673
Publication date
Aug 8, 2013
STICHTING VOOR FUNDAMENTEEL ONDERZOEK DER MATERIE
Alexei Yanson
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD FOR REGENERATING A SURFACE OF AN OPTICAL ELEMENT IN AN XUV R...
Publication number
20100171050
Publication date
Jul 8, 2010
STICHTING VOOR FUNDAMENTEEL ONDERZOEK DER MATERIE
Frederik Bijkerk
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF DETERMINING A PARAMETER REPRESENTING AN ACOUSTIC PROPERTY...
Publication number
20090227870
Publication date
Sep 10, 2009
STICHTING VOOR FUNDAMENTEEL ONDERZOEK DER MATERIE
Roy Gerardus Maria Kolkman
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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