Super Silicon Crystal Research Institute Corp.

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Annaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Epitaxial growth furnace
- Patent number 6,863,735
- Issue date Mar 8, 2005
- Super Silicon Crystal Research Institute Corp.
- Shinji Nakahara
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for manufacturing semiconductor wafer
- Patent number 6,578,589
- Issue date Jun 17, 2003
- Super Silicon Crystal Research Institute Corp.
- Masanori Mayusumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical instrument for measuring shape of wafer
- Patent number 6,504,615
- Issue date Jan 7, 2003
- Super Silicon Crystal Research Institute Corporation
- Kohzo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Slurry useful for wire-saw slicing and evaluation of slurry
- Patent number 6,422,067
- Issue date Jul 23, 2002
- Super Silicon Crystal Research Institute Corporation
- Hiroshi Oishi
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Single crystal growth apparatus and single crystal growth method
- Patent number 6,372,040
- Issue date Apr 16, 2002
- Super Silicon Crystal Research Institute Corp.
- Hirotoshi Yamagishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Single crystal material auxiliary melting apparatus and single crys...
- Patent number 6,361,597
- Issue date Mar 26, 2002
- Super Silicon Crystal Research Institute Corp.
- Nobumitsu Takase
- C30 - CRYSTAL GROWTH
Information Patent Grant
Epitaxial growth furnace
- Patent number 6,262,393
- Issue date Jul 17, 2001
- Super Silicon Crystal Research Institute Corp.
- Masato Imai
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wire cleaning apparatus
- Patent number 6,261,166
- Issue date Jul 17, 2001
- Super Silicon Crystal Research Institute Corp.
- Keiichiro Asakawa
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Sensor for measuring degree of flatness
- Patent number 6,255,664
- Issue date Jul 3, 2001
- Super Silicon Crystal Research Institute Corp.
- Shinji Okawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing epitaxial wafer
- Patent number 6,245,152
- Issue date Jun 12, 2001
- Super Silicon Crystal Research Institute Corp.
- Masato Imai
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wire-sawing machine
- Patent number 6,237,585
- Issue date May 29, 2001
- Super Silicon Crystal Research Institute Corp.
- Hiroshi Oishi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Abnormality transmission system for wire saw
- Patent number 6,234,160
- Issue date May 22, 2001
- Tokyo Seimitsu Co., Ltd.
- Shinji Nagatsuka
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Single crystal pulling apparatus
- Patent number 6,228,167
- Issue date May 8, 2001
- Super Silicon Crystal Research Institute Corp.
- Makoto Kuramoto
- C30 - CRYSTAL GROWTH
Information Patent Grant
Single crystal pull-up apparatus and single crystal pull-up method
- Patent number 6,217,648
- Issue date Apr 17, 2001
- Super Silicon Crystal Research Institute Corporation
- Yutaka Shiraishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of double-side lapping a wafer and an apparatus therefor
- Patent number 6,196,901
- Issue date Mar 6, 2001
- Super Silicon Crystal Research Institute Corp.
- Hideaki Minami
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wire saw control method and wire saw
- Patent number 6,178,961
- Issue date Jan 30, 2001
- Tokyo Seimitsu Co., Ltd.
- Shinji Nagatsuka
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Double side grinding apparatus and double side polishing apparatus
- Patent number 6,165,054
- Issue date Dec 26, 2000
- Super Silicon Crystal Research Institute Corp.
- Kohzo Abe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Single crystal growing apparatus and single crystal growing method
- Patent number 6,117,234
- Issue date Sep 12, 2000
- Super Silicon Crystal Research Institute Corp.
- Hirotoshi Yamagishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Single crystal pulling apparatus, single crystal support mechanism,...
- Patent number 6,077,348
- Issue date Jun 20, 2000
- Super Silicon Crystal Research Institute Corp.
- Yutaka Shiraishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Ingot slicing method and apparatus therefor
- Patent number 6,065,461
- Issue date May 23, 2000
- Super Silicon Crystal Research Institute Corp.
- Keiichiro Asakawa
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Semiconductor single crystal manufacturing apparatus
- Patent number 6,033,472
- Issue date Mar 7, 2000
- Super Silicon Crystal Research Institute Corp.
- Yutaka Shiraishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Single crystal pulling apparatus
- Patent number 6,022,411
- Issue date Feb 8, 2000
- Super Silicon Crystal Research Institute Corp.
- Makoto Kuramoto
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wafer having a laser mark on chamfered edge
- Patent number 6,004,405
- Issue date Dec 21, 1999
- Super Silicon Crystal Research Institute Corp.
- Hiroshi Oishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Optical apparatus for measuring profiles of a wafer
- Patent number 5,995,226
- Issue date Nov 30, 1999
- Super Silicon Crystal Research Institute Corporation
- Kohzo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Production of notchless wafer
- Patent number 5,993,292
- Issue date Nov 30, 1999
- Super Silicon Crystal Research Institute Corp.
- Hiroshi Oishi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of double-side lapping a wafer and an apparatus therefor
- Patent number 5,975,997
- Issue date Nov 2, 1999
- Super Silicon Crystal Research Institute Corp.
- Hideaki Minami
- C30 - CRYSTAL GROWTH

Super Silicon Crystal Research Institute Corp.

Organization

Patents Grantslast 30 patents

Epitaxial growth furnace

Apparatus for manufacturing semiconductor wafer

Optical instrument for measuring shape of wafer

Slurry useful for wire-saw slicing and evaluation of slurry

Single crystal growth apparatus and single crystal growth method

Single crystal material auxiliary melting apparatus and single crys...

Epitaxial growth furnace

Wire cleaning apparatus

Sensor for measuring degree of flatness

Method and apparatus for producing epitaxial wafer

Wire-sawing machine

Abnormality transmission system for wire saw

Single crystal pulling apparatus

Single crystal pull-up apparatus and single crystal pull-up method

Method of double-side lapping a wafer and an apparatus therefor

Wire saw control method and wire saw

Double side grinding apparatus and double side polishing apparatus

Single crystal growing apparatus and single crystal growing method

Single crystal pulling apparatus, single crystal support mechanism,...

Ingot slicing method and apparatus therefor

Semiconductor single crystal manufacturing apparatus

Single crystal pulling apparatus

Wafer having a laser mark on chamfered edge

Optical apparatus for measuring profiles of a wafer

Production of notchless wafer

Method of double-side lapping a wafer and an apparatus therefor

Patents Applicationslast 30 patents

Trademarklast 30 trademarks