SUSS Micro Tec Test Systems GmbH

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Sacka, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20080212078
- Publication date Sep 4, 2008
- SUSS Micro Tec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...
- Publication number 20080143365
- Publication date Jun 19, 2008
- SUSS Micro Tec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING

Trademarklast 30 trademarks