SV Probe Pte. Ltd.

Organization

Singapore, SG

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Modular space transformer for fine pitch vertical probing applications
- Patent number 8,430,676
- Issue date Apr 30, 2013
- SV Probe Pte. Ltd.
- Son Dang
- G01 - MEASURING TESTING
Information Patent Grant
Approach for assembling and repairing probe assemblies using laser...
- Patent number 8,299,394
- Issue date Oct 30, 2012
- SV Probe Pte. Ltd.
- Senthil Theppakuttai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head structure for probe test cards
- Patent number 8,222,912
- Issue date Jul 17, 2012
- SV Probe Pte. Ltd.
- Son N. Dang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with interposer probes
- Patent number 8,058,887
- Issue date Nov 15, 2011
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with segmented substrate
- Patent number 8,058,889
- Issue date Nov 15, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Dual tip test probe assembly
- Patent number 8,026,734
- Issue date Sep 27, 2011
- SV Probe Pte. Ltd.
- Son Ngoc Dang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe structure for a probe card assembly
- Patent number 8,004,299
- Issue date Aug 23, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with stacked substrate
- Patent number 7,898,276
- Issue date Mar 1, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Low force interconnects for probe cards
- Patent number 7,733,104
- Issue date Jun 8, 2010
- SV Probe Pte. Ltd.
- John McGlory
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating cantilever probes
- Patent number 7,721,430
- Issue date May 25, 2010
- SV Probe Pte. Ltd.
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card
- Patent number 7,679,383
- Issue date Mar 16, 2010
- SV Probe Pte. Ltd.
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of attaching probes to the probe car...
- Patent number 7,675,302
- Issue date Mar 9, 2010
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating probe elements for probe card assemblies u...
- Patent number 7,637,009
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Keith Heinemann
- G01 - MEASURING TESTING
Information Patent Grant
Beam assembly method for large area array multi-beam DUT probe cards
- Patent number 7,637,006
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating cantilever probes for probe card assemblies
- Patent number 7,637,007
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip plating
- Patent number 7,638,028
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Automated probe card planarization and alignment methods and tools
- Patent number 7,583,098
- Issue date Sep 1, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with a dielectric strip structure coupled to a...
- Patent number 7,495,459
- Issue date Feb 24, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Spring loaded probe pin assembly
- Patent number 7,479,794
- Issue date Jan 20, 2009
- SV Probe Pte. Ltd.
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Grant
Method of shaping lithographically-produced probe elements
- Patent number 7,462,800
- Issue date Dec 9, 2008
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe repair methods
- Patent number 7,437,813
- Issue date Oct 21, 2008
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Blade probe and blade probe card
- Patent number 7,432,728
- Issue date Oct 7, 2008
- SV Probe Pte. Ltd.
- Habib Kilicaslan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing co-planar bonding pads on a subs...
- Patent number 7,393,773
- Issue date Jul 1, 2008
- SV Probe Pte. Ltd.
- Edward L. Malantonio
- G01 - MEASURING TESTING
Information Patent Grant
Probe pad structure in a ceramic space transformer
- Patent number 7,374,811
- Issue date May 20, 2008
- SV Probe Pte. Ltd.
- Chi Shih Chang
- G01 - MEASURING TESTING
Information Patent Grant
Direct attachment of coaxial cables
- Patent number 7,364,461
- Issue date Apr 29, 2008
- SV Probe Pte. Ltd.
- Gerald W. Back
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe attach tool
- Patent number 7,311,239
- Issue date Dec 25, 2007
- SV Probe Pte. Ltd.
- Edward T. Laurent
- G01 - MEASURING TESTING
Information Patent Grant
Stacked tip cantilever electrical connector
- Patent number 7,279,917
- Issue date Oct 9, 2007
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with dielectric structure
- Patent number 7,279,911
- Issue date Oct 9, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of attaching probes to the probe car...
- Patent number 7,271,602
- Issue date Sep 18, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Method of probe tip shaping and cleaning
- Patent number 7,182,672
- Issue date Feb 27, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- B24 - GRINDING POLISHING

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Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT BOARD FOR TESTING AND METHOD OF OPERATING THE SAME
- Publication number 20190265277
- Publication date Aug 29, 2019
- SV PROBE PTE. LTD.
- Sheng-Yu Tseng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Approach for assembling and repairing probe assemblies using laser...
- Publication number 20080308536
- Publication date Dec 18, 2008
- SV Probe Pte Ltd
- Senthil Theppakuttai
- G01 - MEASURING TESTING

SV Probe Pte. Ltd.

Organization

Patents Grantslast 30 patents

Modular space transformer for fine pitch vertical probing applications

Approach for assembling and repairing probe assemblies using laser...

Probe head structure for probe test cards

Probe card assembly with interposer probes

Probe card with segmented substrate

Dual tip test probe assembly

Cantilever probe structure for a probe card assembly

Probe card with stacked substrate

Low force interconnects for probe cards

Approach for fabricating cantilever probes

Cantilever probe card

Probe card assembly and method of attaching probes to the probe car...

Approach for fabricating probe elements for probe card assemblies u...

Beam assembly method for large area array multi-beam DUT probe cards

Approach for fabricating cantilever probes for probe card assemblies

Probe tip plating

Automated probe card planarization and alignment methods and tools

Probe card assembly with a dielectric strip structure coupled to a...

Spring loaded probe pin assembly

Method of shaping lithographically-produced probe elements

Probe repair methods

Blade probe and blade probe card

Method and apparatus for producing co-planar bonding pads on a subs...

Probe pad structure in a ceramic space transformer

Direct attachment of coaxial cables

Probe attach tool

Stacked tip cantilever electrical connector

Probe card assembly with dielectric structure

Probe card assembly and method of attaching probes to the probe car...

Method of probe tip shaping and cleaning

Patents Applicationslast 30 patents

CIRCUIT BOARD FOR TESTING AND METHOD OF OPERATING THE SAME

Approach for assembling and repairing probe assemblies using laser...