SVXR, Inc.

Organization

San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Super-resolution x-ray imaging method and apparatus
- Patent number 11,055,821
- Issue date Jul 6, 2021
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution X-ray imaging method and apparatus
- Patent number 10,692,184
- Issue date Jun 23, 2020
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices processed using x-rays
- Patent number 10,559,396
- Issue date Feb 11, 2020
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed X-ray microscope
- Patent number 9,646,732
- Issue date May 9, 2017
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Devices processed using x-rays
- Patent number 9,607,724
- Issue date Mar 28, 2017
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High speed x-ray inspection microscope
- Patent number 9,129,715
- Issue date Sep 8, 2015
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS
- Publication number 20220042795
- Publication date Feb 10, 2022
- SVXR, Inc.
- Brennan Lovelace Peterson
- G01 - MEASURING TESTING
Information Patent Application
Super-Resolution X-Ray Imaging Method and Apparatus
- Publication number 20210295469
- Publication date Sep 23, 2021
- SVXR, Inc.
- Edward R. RATNER
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210279878
- Publication date Sep 9, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Defects Detection and Classification Using...
- Publication number 20210010953
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Manufacturing Printed Circuit Board based o...
- Publication number 20210014979
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210012054
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Product Failure Prediction based on X-ray I...
- Publication number 20210010954
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Process Control Based on X-ray Inspection
- Publication number 20210011177
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Detecting Defects in Devices Using X-rays
- Publication number 20210012499
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR RAPIDLY CLASSIFYING DEFECTS IN SUBCOMPONEN...
- Publication number 20200380654
- Publication date Dec 3, 2020
- SVXR, Inc.
- Edward R. RATNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR RAPID INSPECTION OF SUBCOMPONENTS OF MANUF...
- Publication number 20200380664
- Publication date Dec 3, 2020
- SVXR, Inc.
- Edward R. RATNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS
- Publication number 20200279351
- Publication date Sep 3, 2020
- SVXR, Inc.
- Edward R. RATNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS
- Publication number 20200013145
- Publication date Jan 9, 2020
- SVXR, Inc.
- Edward R. RATNER
- G01 - MEASURING TESTING
Information Patent Application
Devices Processed Using X-Rays
- Publication number 20170200524
- Publication date Jul 13, 2017
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
90284327 - X200
- Serial number 90284327
- Registration number 6426673
- Filing date Oct 28, 2020
- SVXR Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90278931 - SVXR
- Serial number 90278931
- Registration number 6432602
- Filing date Oct 26, 2020
- SVXR Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86905769 - XTEM
- Serial number 86905769
- Filing date Feb 12, 2016
- SVXR, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Super-resolution x-ray imaging method and apparatus

Methods and systems for printed circuit board design based on autom...

Super-resolution X-ray imaging method and apparatus

Devices processed using x-rays

High speed X-ray microscope

Devices processed using x-rays

High speed x-ray inspection microscope

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS

Super-Resolution X-Ray Imaging Method and Apparatus

Methods and Systems for Printed Circuit Board Design Based on Autom...

Methods and Systems for Defects Detection and Classification Using...

Methods and Systems for Manufacturing Printed Circuit Board based o...

Methods and Systems for Printed Circuit Board Design Based on Autom...

Methods and Systems for Product Failure Prediction based on X-ray I...

Methods and Systems for Process Control Based on X-ray Inspection

Methods and Systems for Detecting Defects in Devices Using X-rays

METHOD AND APPARATUS FOR RAPIDLY CLASSIFYING DEFECTS IN SUBCOMPONEN...

METHOD AND APPARATUS FOR RAPID INSPECTION OF SUBCOMPONENTS OF MANUF...

SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS

SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS

Devices Processed Using X-Rays

Trademarklast 30 trademarks

90284327 - X200

90278931 - SVXR

86905769 - XTEM