Syft Technologies Limited

Organization

  • Middleton, Chrischurch, NZ

Patents Grantslast 30 patents

  • Information Patent Grant

    Method of chemical ionization mass spectrometry

    • Patent number 7,785,893
    • Issue date Aug 31, 2010
    • SYFT Technologies Limited
    • Murray James McEwan
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    SIFT-MS instruments

    • Patent number 7,429,730
    • Issue date Sep 30, 2008
    • Syft Technologies Limited
    • Geoffrey Charles Peck
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

  • Information Trademark

    98138946 - SYFT TRACER

    • Serial number 98138946
    • Filing date Aug 18, 2023
    • SYFT Technologies Limited
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments