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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
9,696,377
Issue date
Jul 4, 2017
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT method for detecting or locating crossing cloc...
Patent number
9,678,156
Issue date
Jun 13, 2017
SYNTEST TECHNOLOGIES, INC.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
9,316,688
Issue date
Apr 19, 2016
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
9,274,168
Issue date
Mar 1, 2016
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
9,121,902
Issue date
Sep 1, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
9,110,139
Issue date
Aug 18, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
9,091,730
Issue date
Jul 28, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
9,057,763
Issue date
Jun 16, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design (CAD) multiple-capture DFT system for detecti...
Patent number
9,046,572
Issue date
Jun 2, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
9,026,875
Issue date
May 5, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for hybrid ring generator design
Patent number
8,949,299
Issue date
Feb 3, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
8,775,985
Issue date
Jul 8, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
8,769,359
Issue date
Jul 1, 2014
Syntest Technologies, Inc.
Luang-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
8,667,451
Issue date
Mar 4, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
8,543,950
Issue date
Sep 24, 2013
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing 3D integrated circuits
Patent number
8,522,096
Issue date
Aug 27, 2013
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system to reduce peak capture power during sel...
Patent number
8,458,544
Issue date
Jun 4, 2013
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low-pin-count scan compression
Patent number
8,335,954
Issue date
Dec 18, 2012
Syntest Technologies, Inc.
Nur A. Touba
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low-pin-count scan compression
Patent number
8,230,282
Issue date
Jul 24, 2012
Syntest Technologies, Inc.
Nur A. Touba
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
8,219,945
Issue date
Jul 10, 2012
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system to reduce peak capture power during sel...
Patent number
8,091,002
Issue date
Jan 3, 2012
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low-pin-count scan compression
Patent number
7,996,741
Issue date
Aug 9, 2011
Syntest Technologies, Inc.
Nur A. Touba
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for unifying self-test with scan-test during p...
Patent number
7,945,830
Issue date
May 17, 2011
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for pipelined scan compression
Patent number
7,945,833
Issue date
May 17, 2011
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
X-canceling multiple-input signature register (MISR) for compacting...
Patent number
7,925,947
Issue date
Apr 12, 2011
Syntest Technologies, Inc.
Nur A. Touba
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for scan-based integrated circuits
Patent number
7,904,773
Issue date
Mar 8, 2011
Syntest Technologies, Inc.
Laung-Terng (L. T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
7,904,857
Issue date
Mar 8, 2011
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for redundancy reconfiguration of faculty memories
Patent number
7,783,940
Issue date
Aug 24, 2010
Syntest Technologies, Inc.
Lizhen Yu
G11 - INFORMATION STORAGE
Information
Patent Grant
Compacting test responses using X-driven compactor
Patent number
7,779,322
Issue date
Aug 17, 2010
Syntest Technologies, Inc.
Zhigang Wang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-capture DFT system for detecting or locating crossing cloc...
Patent number
7,779,323
Issue date
Aug 17, 2010
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
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Patents Applications
last 30 patents
Information
Patent Application
MULTIPLE-CAPTURE DFT METHOD FOR DETECTING OR LOCATING CROSSING CLOC...
Publication number
20160131707
Publication date
May 12, 2016
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE-CAPTURE DFT SYSTEM FOR DETECTING OR LOCATING CROSSING CLOC...
Publication number
20150338465
Publication date
Nov 26, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based...
Publication number
20150338461
Publication date
Nov 26, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE-CAPTURE DFT SYSTEM FOR DETECTING OR LOCATING CROSSING CLOC...
Publication number
20150316616
Publication date
Nov 5, 2015
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based...
Publication number
20140344636
Publication date
Nov 20, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Multiple-Capture DFT System for Detecting or Locating Crossing Cloc...
Publication number
20140223251
Publication date
Aug 7, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based...
Publication number
20140149816
Publication date
May 29, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
Publication number
20140143623
Publication date
May 22, 2014
Syntest Technologies, Inc.
Nur A. TOUBA
G01 - MEASURING TESTING
Information
Patent Application
Multiple-Capture DFT System for Detecting or Locating Crossing Cloc...
Publication number
20140082446
Publication date
Mar 20, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Multiple-Capture DFT System for Detecting or Locating Crossing Cloc...
Publication number
20140075256
Publication date
Mar 13, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Computer-Aided Design (CAD) Multiple-Capture DFT System for Detecti...
Publication number
20140075257
Publication date
Mar 13, 2014
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR HYBRID RING GENERATOR DESIGN
Publication number
20130036146
Publication date
Feb 7, 2013
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
Publication number
20120331361
Publication date
Dec 27, 2012
Syntest Technologies, Inc.
Laung-Terng (L.-T.) WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
Publication number
20120266036
Publication date
Oct 18, 2012
Syntest Technologies, Inc.
Nur A. TOUBA
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER-AIDED DESIGN SYSTEM TO AUTOMATE SCAN SYNTHESIS AT REGISTER...
Publication number
20120246604
Publication date
Sep 27, 2012
Syntest Technologies, Inc.
Laung-Terng (L. -T.) WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...
Publication number
20120166903
Publication date
Jun 28, 2012
Syntest Technologies, Inc.
Laung-Terng WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR TESTING 3D INTEGRATED CIRCUITS
Publication number
20120110402
Publication date
May 3, 2012
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER-AIDED DESIGN SYSTEM TO AUTOMATE SCAN SYNTHESIS AT REGISTER...
Publication number
20110197171
Publication date
Aug 11, 2011
Syntest Technologies, Inc.
Laung-Terng (L.-T.) WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...
Publication number
20100287430
Publication date
Nov 11, 2010
Syntest Technologies, Inc.
Laung-Terng WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
Publication number
20090235132
Publication date
Sep 17, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Multiple-capture DFT system for detecting or locating crossing cloc...
Publication number
20090132880
Publication date
May 21, 2009
Syntest Technologies, Inc.
Laung-Terng (L.- T.) Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multiple-Capture DFT system for scan-based integrated circuits
Publication number
20090070646
Publication date
Mar 12, 2009
Syntest Technologies, Inc.
Laung-Terng (L.T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for unifying self-test with scan-test during p...
Publication number
20090037786
Publication date
Feb 5, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
Publication number
20080276143
Publication date
Nov 6, 2008
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
Publication number
20080276141
Publication date
Nov 6, 2008
Syntest Technologies Inc.
Laung-Terng(L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Computer-aided design system to automate scan synthesis at register...
Publication number
20080134107
Publication date
Jun 5, 2008
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Computer-aided design (CAD) multiple-capture DFT system for detecti...
Publication number
20070255988
Publication date
Nov 1, 2007
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for diagnosing failures in an integrated circu...
Publication number
20070168803
Publication date
Jul 19, 2007
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Mask network design for scan-based integrated circuits
Publication number
20060156122
Publication date
Jul 13, 2006
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Multiple-capture DFT system for scan-based integrated circuits
Publication number
20050235186
Publication date
Oct 20, 2005
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING