SYSMEX AMERICA, INC

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LINCOLNSHIRE, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,401,350
- Issue date Sep 3, 2019
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and computer program product
- Patent number 10,401,351
- Issue date Sep 3, 2019
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20190339258
- Publication date Nov 7, 2019
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING

Trademarklast 30 trademarks