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X-ray inspection apparatus
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Patent number 10,859,516
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Issue date Dec 8, 2020
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System Square Inc.
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Noriaki Ikeda
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G01 - MEASURING TESTING
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X-ray inspection system
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Patent number 9,865,424
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Issue date Jan 9, 2018
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SYSTEM SQUARE INC.
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Noriaki Ikeda
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H01 - BASIC ELECTRIC ELEMENTS
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Package inspection system
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Patent number 9,733,384
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Issue date Aug 15, 2017
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System Square Inc.
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Atsushi Suzuki
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G01 - MEASURING TESTING
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Package inspection system
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Patent number 9,541,499
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Issue date Jan 10, 2017
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SYSTEM SQUARE INC.
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Noriaki Ikeda
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B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
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79410069 - SYSTEM SQUARE
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Serial number 79410069
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Filing date Jul 12, 2024
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System Square Inc.
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7 - Machines and machine tools
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85742568 - SQUARE
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Serial number 85742568
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Registration number 4573014
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Filing date Oct 1, 2012
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System Square Inc.
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9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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79113041 - SYSTEM SQUARE
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Serial number 79113041
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Registration number 4296875
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Filing date Jan 30, 2012
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System Square Inc.
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9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments