System Square Inc.

Organization

  • Nagaoka-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray inspection apparatus

    • Patent number 10,859,516
    • Issue date Dec 8, 2020
    • System Square Inc.
    • Noriaki Ikeda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray inspection system

    • Patent number 9,865,424
    • Issue date Jan 9, 2018
    • SYSTEM SQUARE INC.
    • Noriaki Ikeda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Package inspection system

    • Patent number 9,733,384
    • Issue date Aug 15, 2017
    • System Square Inc.
    • Atsushi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Package inspection system

    • Patent number 9,541,499
    • Issue date Jan 10, 2017
    • SYSTEM SQUARE INC.
    • Noriaki Ikeda
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

  • Information Trademark

    79410069 - SYSTEM SQUARE

    • Serial number 79410069
    • Filing date Jul 12, 2024
    • System Square Inc.
    • 7 - Machines and machine tools
  • Information Trademark

    85742568 - SQUARE

    • Serial number 85742568
    • Registration number 4573014
    • Filing date Oct 1, 2012
    • System Square Inc.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • Information Trademark

    79113041 - SYSTEM SQUARE

    • Serial number 79113041
    • Registration number 4296875
    • Filing date Jan 30, 2012
    • System Square Inc.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments