Systems on Silicon Manufacturing Co. PTE. LTD.

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced intermetal dielectric adhesion
- Patent number 11,282,744
- Issue date Mar 22, 2022
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Pankaj Kumar Uttwani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimum layout of dies on a wafer
- Patent number 11,163,238
- Issue date Nov 2, 2021
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Seng Jian Tee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-volatile memory cell structure and a method of fabricating the...
- Patent number 8,629,032
- Issue date Jan 14, 2014
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Sheng He Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EEPROM cell structure and a method of fabricating the same
- Patent number 8,564,043
- Issue date Oct 22, 2013
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Sheng He Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring tool performance
- Patent number 7,778,798
- Issue date Aug 17, 2010
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Swee Keng Ang
- G07 - CHECKING-DEVICES
Information Patent Grant
Metal comb structures, methods for their fabrication and failure an...
- Patent number 7,772,590
- Issue date Aug 10, 2010
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Hing Poh Kuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining a predicted flash endurance Vt of...
- Patent number 7,693,667
- Issue date Apr 6, 2010
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Eu Gene Glen Foo
- G11 - INFORMATION STORAGE
Information Patent Grant
Sensing system
- Patent number 7,663,743
- Issue date Feb 16, 2010
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Alan Torres Garcia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card needle cleaning frequency optimization
- Patent number 7,642,798
- Issue date Jan 5, 2010
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Beng Ghee Tan
- B08 - CLEANING
Information Patent Grant
System and method for detection of spatial signature yield loss
- Patent number 7,400,391
- Issue date Jul 15, 2008
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Eng Keong Ho
- G01 - MEASURING TESTING
Information Patent Grant
Method of electro migration testing
- Patent number 7,394,280
- Issue date Jul 1, 2008
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Yong Han Frankie Low
- G01 - MEASURING TESTING
Information Patent Grant
Delineation of wafers
- Patent number 7,355,173
- Issue date Apr 8, 2008
- Systems on Silicon Manufacturing Co., Pte. Ltd.
- Hing Poh Kuan
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer magnet chamber liner
- Patent number 7,351,990
- Issue date Apr 1, 2008
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Wei Zhong Cao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curve tracing device and method
- Patent number 7,272,760
- Issue date Sep 18, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Seng Hin Tan
- G01 - MEASURING TESTING
Information Patent Grant
Polishing head elbow fitting
- Patent number 7,247,084
- Issue date Jul 24, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Meng Fei Koh
- B24 - GRINDING POLISHING
Information Patent Grant
Method for detecting and monitoring wafer probing process instability
- Patent number 7,230,439
- Issue date Jun 12, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Beng Ghee Tan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detection of spatial signature yield loss
- Patent number 7,211,450
- Issue date May 1, 2007
- Systems on Silicon Manufacturing Co., Pte. Ltd.
- Eng Keong Ho
- G01 - MEASURING TESTING
Information Patent Grant
Planar view TEM sample preparation from circuit layer structures
- Patent number 7,208,965
- Issue date Apr 24, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Wen Yi Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of local interconnect lines
- Patent number 7,208,363
- Issue date Apr 24, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Stephane Dufrenne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing improved membranes
- Patent number 7,201,642
- Issue date Apr 10, 2007
- Systems on Silicon Manufacturing Co. Pte. Ltd.
- Meng Fei Koh
- B24 - GRINDING POLISHING

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Patents Applicationslast 30 patents

Information Patent Application
OPTIMUM LAYOUT OF DIES ON A WAFER
- Publication number 20210103223
- Publication date Apr 8, 2021
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Seng Jian TEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL MECHANICAL POLISHING (CMP) POLISHING HEAD WITH IMPROVED VA...
- Publication number 20210094146
- Publication date Apr 1, 2021
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Jayakumar PACHAIYAPPAN
- B24 - GRINDING POLISHING
Information Patent Application
ENHANCED INTERMETAL DIELECTRIC ADHESION
- Publication number 20210098289
- Publication date Apr 1, 2021
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Pankaj Kumar UTTWANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL-INSULATOR-METAL CAPACITOR AND A METHOD OF FABRICATING THE SAME
- Publication number 20120211866
- Publication date Aug 23, 2012
- Systems on Silicon Manufacturing Co. PTE LTD.
- Chung-Wen Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EEPROM CELL STRUCTURE AND A METHOD OF FABRICATING THE SAME
- Publication number 20120181594
- Publication date Jul 19, 2012
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-VOLATILE MEMORY CELL STRUCTURE AND A METHOD OF FABRICATING THE...
- Publication number 20120181595
- Publication date Jul 19, 2012
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL-INSULATOR-METAL CAPACITOR AND METHOD FOR FABRICATING METAL-IN...
- Publication number 20110278697
- Publication date Nov 17, 2011
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Poh Cheng Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATION OF SINGLE ELECTRON TRANSISTORS
- Publication number 20090146222
- Publication date Jun 11, 2009
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Naveen AGRAWAL
- B82 - NANO-TECHNOLOGY
Information Patent Application
METAL COMB STRUCTURES, METHODS FOR THEIR FABRICATION AND FAILURE AN...
- Publication number 20080218749
- Publication date Sep 11, 2008
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Hing Poh Kuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING A PREDICTED FLASH ENDURANCE Vt OF...
- Publication number 20080126000
- Publication date May 29, 2008
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Eu Gene Glen FOO
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR MEASURING TOOL PERFORMANCE
- Publication number 20080091382
- Publication date Apr 17, 2008
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Swee Keng Ang
- G05 - CONTROLLING REGULATING
Information Patent Application
Cmp Slurry Strainer
- Publication number 20070262030
- Publication date Nov 15, 2007
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Koh Meng Fei
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS FOR THERMOCOUPLE SETTING AND FLAT ZONE PROCEDURE IN A FUR...
- Publication number 20070258505
- Publication date Nov 8, 2007
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Sanjeev Jindal
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Detection of Spatial Signature Yield Loss
- Publication number 20070161132
- Publication date Jul 12, 2007
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Eng Keong HO
- G05 - CONTROLLING REGULATING
Information Patent Application
Selective reactive ion etching of wafers
- Publication number 20070095786
- Publication date May 3, 2007
- Systems on Silicon Manufacturing Co. PTE LTD.
- Sim Kwang Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for detecting and monitoring wafer probing process instability
- Publication number 20060149505
- Publication date Jul 6, 2006
- Systems on Silicon Manufacturing Co. PTE LTD.
- Ben Ghee Tan
- G01 - MEASURING TESTING
Information Patent Application
Titanium underlayer for lines in semiconductor devices
- Publication number 20050116350
- Publication date Jun 2, 2005
- Systems on Silicon Manufacturing Co. PTE. LTD.
- Khim Hong Ng
- H01 - BASIC ELECTRIC ELEMENTS

Systems on Silicon Manufacturing Co. PTE. LTD.

Organization

Patents Grantslast 30 patents

Enhanced intermetal dielectric adhesion

Optimum layout of dies on a wafer

Non-volatile memory cell structure and a method of fabricating the...

EEPROM cell structure and a method of fabricating the same

System and method for measuring tool performance

Metal comb structures, methods for their fabrication and failure an...

Method and system for determining a predicted flash endurance Vt of...

Sensing system

Probe card needle cleaning frequency optimization

System and method for detection of spatial signature yield loss

Method of electro migration testing

Delineation of wafers

Analyzer magnet chamber liner

Curve tracing device and method

Polishing head elbow fitting

Method for detecting and monitoring wafer probing process instability

System and method for detection of spatial signature yield loss

Planar view TEM sample preparation from circuit layer structures

Fabrication of local interconnect lines

Process for producing improved membranes

Patents Applicationslast 30 patents

OPTIMUM LAYOUT OF DIES ON A WAFER

CHEMICAL MECHANICAL POLISHING (CMP) POLISHING HEAD WITH IMPROVED VA...

ENHANCED INTERMETAL DIELECTRIC ADHESION

METAL-INSULATOR-METAL CAPACITOR AND A METHOD OF FABRICATING THE SAME

EEPROM CELL STRUCTURE AND A METHOD OF FABRICATING THE SAME

NON-VOLATILE MEMORY CELL STRUCTURE AND A METHOD OF FABRICATING THE...

METAL-INSULATOR-METAL CAPACITOR AND METHOD FOR FABRICATING METAL-IN...

METHOD FOR FABRICATION OF SINGLE ELECTRON TRANSISTORS

METAL COMB STRUCTURES, METHODS FOR THEIR FABRICATION AND FAILURE AN...

METHOD AND SYSTEM FOR DETERMINING A PREDICTED FLASH ENDURANCE Vt OF...

SYSTEM AND METHOD FOR MEASURING TOOL PERFORMANCE

Cmp Slurry Strainer

APPARATUS FOR THERMOCOUPLE SETTING AND FLAT ZONE PROCEDURE IN A FUR...

System and Method for Detection of Spatial Signature Yield Loss

Selective reactive ion etching of wafers

Method for detecting and monitoring wafer probing process instability

Titanium underlayer for lines in semiconductor devices