Taiwan Semiconductor Manufacturing Co., Lid.

Organization

Hsinchu, TW

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Adjustment circuit for partitioned memory block
- Patent number 11,024,395
- Issue date Jun 1, 2021
- Taiwan Semiconductor Manufacturing Co., Lid.
- Yu-Der Chih
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONTACT STRUCTURE FOR SEMICONDUCTOR DEVICE
- Publication number 20240021474
- Publication date Jan 18, 2024
- Taiwan Semiconductor Manufacturing Co., Lid.
- Yun-Yu HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR
- Publication number 20230395694
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Co., Lid.
- Chan-Hong CHERN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION SYSTEM AND METHOD OF USING THE SAME
- Publication number 20230049405
- Publication date Feb 16, 2023
- Taiwan Semiconductor Manufacturing Co., Lid.
- Chih-Kai Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANNEALING SYSTEM AND METHOD FOR USING THE SAME
- Publication number 20220415668
- Publication date Dec 29, 2022
- Taiwan Semiconductor Manufacturing Co., Lid.
- Yi-Fan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSIVATION LAYERS FOR SEMICONDUCTOR DEVICES
- Publication number 20220384613
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Co., Lid.
- Cheng-Yi Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit and Layout Method for Standard Cell Structures
- Publication number 20220058330
- Publication date Feb 24, 2022
- Taiwan Semiconductor Manufacturing Co., Lid.
- Sheng-Hsiung CHEN
- G06 - COMPUTING CALCULATING COUNTING

Taiwan Semiconductor Manufacturing Co., Lid.

Organization

Patents Grantslast 30 patents

Adjustment circuit for partitioned memory block

Patents Applicationslast 30 patents

CONTACT STRUCTURE FOR SEMICONDUCTOR DEVICE

GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR

DEFECT INSPECTION SYSTEM AND METHOD OF USING THE SAME

ANNEALING SYSTEM AND METHOD FOR USING THE SAME

PASSIVATION LAYERS FOR SEMICONDUCTOR DEVICES

Integrated Circuit and Layout Method for Standard Cell Structures

Trademarklast 30 trademarks