Takeda Riken Co., Ltd.

Organization

Tokyo, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
IC test equipment having input magazine replenisher
- Patent number 4,760,924
- Issue date Aug 2, 1988
- Takeda Riken Co., Ltd.
- Hiroshi Sato
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
IC test equipment
- Patent number 4,715,501
- Issue date Dec 29, 1987
- Takeda Riken Co., Ltd.
- Hiroshi Sato
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
IC test equipment
- Patent number 4,691,831
- Issue date Sep 8, 1987
- Takeda Riken Co., Ltd.
- Kempei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Signal detector
- Patent number 4,620,147
- Issue date Oct 28, 1986
- Takeda Riken Co., Ltd.
- Shoji Niki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test pattern generating apparatus
- Patent number 4,586,181
- Issue date Apr 29, 1986
- Takeda Riken Co., Ltd.
- Masao Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Logic circuit test system
- Patent number 4,584,683
- Issue date Apr 22, 1986
- Takeda Riken Co., Ltd.
- Masao Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Logic circuit test system
- Patent number 4,583,041
- Issue date Apr 15, 1986
- Takeda Riken Co., Ltd.
- Shigehiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Multi-slope analog-to-digital converter
- Patent number 4,574,271
- Issue date Mar 4, 1986
- Takeda Riken Co., Ltd.
- Eiichi Yada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
I/O Control system for data transmission and reception between cent...
- Patent number 4,573,120
- Issue date Feb 25, 1986
- Takeda Riken Co., Ltd.
- Yoshichika Ichimiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration of a multi-slope A-D converter
- Patent number 4,559,521
- Issue date Dec 17, 1985
- Takeda Riken Co., Ltd.
- Eiichi Yada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test pattern generating apparatus
- Patent number 4,555,663
- Issue date Nov 26, 1985
- Takeda Riken Co., Ltd.
- Masao Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Counter-address memory for multi-channel timing signals
- Patent number 4,553,100
- Issue date Nov 12, 1985
- Takeda Riken Co., Ltd.
- Junji Nishiura
- G11 - INFORMATION STORAGE
Information Patent Grant
Period and frequency measuring instrument
- Patent number 4,544,884
- Issue date Oct 1, 1985
- Takeda Riken Co., Ltd.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator for digital spectrum analyzer
- Patent number 4,539,518
- Issue date Sep 3, 1985
- Takeda Riken Co., Ltd.
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Interval-expanding timer
- Patent number 4,523,288
- Issue date Jun 11, 1985
- Takeda Riken Co., Ltd.
- Mishio Hayashi
- G04 - HOROLOGY
Information Patent Grant
IC tester
- Patent number 4,523,312
- Issue date Jun 11, 1985
- Takeda Riken Co., Ltd.
- Kunio Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Swept frequency signal generator
- Patent number 4,513,256
- Issue date Apr 23, 1985
- Takeda Riken Co., Ltd.
- Takenori Kurihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay pulse generating circuit
- Patent number 4,504,749
- Issue date Mar 12, 1985
- Takeda Riken Co., Ltd.
- Kenji Yoshida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
IC Tester
- Patent number 4,497,056
- Issue date Jan 29, 1985
- Takeda Riken Co. Ltd.
- Shigeru Sugamori
- G01 - MEASURING TESTING
Information Patent Grant
Frequency synthesizer
- Patent number 4,488,123
- Issue date Dec 11, 1984
- Takeda Riken Co., Ltd.
- Takenori Kurihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Data transfer system
- Patent number 4,486,750
- Issue date Dec 4, 1984
- Takeda Riken Co. Ltd.
- Tetsuo Aoki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
YIG Tuned filter having coupling loops formed from conductively lay...
- Patent number 4,480,238
- Issue date Oct 30, 1984
- Takeda Riken Co. Ltd.
- Jun-ichi Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS

Takeda Riken Co., Ltd.

Organization

Patents Grantslast 30 patents

IC test equipment having input magazine replenisher

IC test equipment

IC test equipment

Signal detector

Test pattern generating apparatus

Logic circuit test system

Logic circuit test system

Multi-slope analog-to-digital converter

I/O Control system for data transmission and reception between cent...

Calibration of a multi-slope A-D converter

Test pattern generating apparatus

Counter-address memory for multi-channel timing signals

Period and frequency measuring instrument

Signal generator for digital spectrum analyzer

Interval-expanding timer

IC tester

Swept frequency signal generator

Delay pulse generating circuit

IC Tester

Frequency synthesizer

Data transfer system

YIG Tuned filter having coupling loops formed from conductively lay...