Takeda Riken Kogyo Kabushikikaisha

Organization

Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Digital-to-analog converting apparatus equipped with calibrating fu...
- Patent number 4,835,535
- Issue date May 30, 1989
- Nippon Telegraph & Telephone Public Corporation
- Akinori Shibayama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Clocked logic delay device which corrects for the phase difference...
- Patent number 4,719,365
- Issue date Jan 12, 1988
- Takeda Riken Kogyo Kabushikikaisha
- Toshiaki Misono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Burst signal generator
- Patent number 4,713,788
- Issue date Dec 15, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Toshiharu Kasahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic analyzer
- Patent number 4,701,918
- Issue date Oct 20, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Takayuki Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic analyzer
- Patent number 4,696,004
- Issue date Sep 22, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Takayuki Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for measuring average frequencies
- Patent number 4,680,540
- Issue date Jul 14, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Shoji Niki
- G01 - MEASURING TESTING
Information Patent Grant
Pattern generator
- Patent number 4,670,879
- Issue date Jun 2, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Noboru Okino
- G01 - MEASURING TESTING
Information Patent Grant
Multi-trigger logic analyzer
- Patent number 4,654,848
- Issue date Mar 31, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Kazuo Noguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-clock generator
- Patent number 4,623,845
- Issue date Nov 18, 1986
- Takeda Riken Kogyo Kabushikikaisha
- Keiichiro Ide
- G01 - MEASURING TESTING
Information Patent Grant
Time interval measuring instrument
- Patent number 4,611,926
- Issue date Sep 16, 1986
- Takeda Riken Kogyo Kabushikikaisha
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Phase difference measuring apparatus
- Patent number 4,600,994
- Issue date Jul 15, 1986
- Takeda Riken Kogyo Kabushikikaisha
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Noise field intensity measuring apparatus
- Patent number 4,477,770
- Issue date Oct 16, 1984
- Takeda Riken Kogyo Kabushikikaisha
- Shigeki Tojo
- G01 - MEASURING TESTING
Information Patent Grant
Average frequency measuring apparatus
- Patent number 4,468,614
- Issue date Aug 28, 1984
- Takeda Riken Kogyo Kabushiki Kaisha
- Toshiro Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus
- Patent number 4,464,656
- Issue date Aug 7, 1984
- Takeda Riken Kogyo Kabushiki Kaisha
- Masakazu Nakamura
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Variable tuning device
- Patent number 4,460,879
- Issue date Jul 17, 1984
- Takeda Riken Kogyo Kabushiki Kaisha
- Masaaki Hirose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Plural phase locked loop frequency synthesizer
- Patent number 4,459,560
- Issue date Jul 10, 1984
- Takeda Riken Kogyo Kabushikikaisha
- Takenori Kurihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DA Converter
- Patent number 4,459,580
- Issue date Jul 10, 1984
- Takeda Riken Kogyo Kabushikikaisha
- Yasuo Furukawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Spectrum analyzer
- Patent number 4,451,782
- Issue date May 29, 1984
- Takeda Riken Kogyo Kabushiki Kaisha
- Hitoshi Ashida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device test apparatus
- Patent number 4,414,665
- Issue date Nov 8, 1983
- Nippon Telegraph and Telephone Public Corp.
- Kenji Kimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory test pattern generating apparatus
- Patent number 4,402,081
- Issue date Aug 30, 1983
- Nippon Telegraph and Telephone Public Corp.
- Yoshichika Ichimiya
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for measuring the oscillation frequency of a voltage cont...
- Patent number 4,374,358
- Issue date Feb 15, 1983
- Takeda Riken Kogyo Kabushiki Kaisha
- Masaaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Contact drive assembly for use with electronic part test equipment
- Patent number 4,370,011
- Issue date Jan 25, 1983
- Takeda Riken Kogyo Kabushikikaisha
- Kenpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Auto-calibrated D-A converter
- Patent number 4,369,432
- Issue date Jan 18, 1983
- Takeda Riken Kogyo Kabushikikaisha
- Tsukasa Mikami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory test equipment
- Patent number 4,369,511
- Issue date Jan 18, 1983
- Nippon Telegraph and Telephone Public Corp.
- Kenji Kimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Reference voltage generator
- Patent number 4,367,437
- Issue date Jan 4, 1983
- Takeda Riken Kogyo Kabushikikaisha
- Tsukasa Mikami
- G05 - CONTROLLING REGULATING
Information Patent Grant
A-D Converter with fine resolution
- Patent number 4,354,176
- Issue date Oct 12, 1982
- Takeda Riken Kogyo Kabushikikaisha
- Hiroshi Aihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Stabilized sweep frequency generator with adjustable start and stop...
- Patent number 4,349,789
- Issue date Sep 14, 1982
- Takeda Riken Kogyo Kabushikikaisha
- Takenori Kurihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Variable current source
- Patent number 4,349,777
- Issue date Sep 14, 1982
- Takeda Riken Kogyo Kabushikikaisha
- Masakazu Mitamura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-compensating A-D converter
- Patent number 4,315,254
- Issue date Feb 9, 1982
- Takeda Riken Kogyo Kabushiki Kaisha
- Jun Honjyo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Logic test system permitting test pattern changes without dummy cycles
- Patent number 4,313,200
- Issue date Jan 26, 1982
- Takeda Riken Kogyo Kabushikikaisha
- Junji Nishiura
- G01 - MEASURING TESTING

Takeda Riken Kogyo Kabushikikaisha

Organization

Patents Grantslast 30 patents

Digital-to-analog converting apparatus equipped with calibrating fu...

Clocked logic delay device which corrects for the phase difference...

Burst signal generator

Logic analyzer

Logic analyzer

Device for measuring average frequencies

Pattern generator

Multi-trigger logic analyzer

Multi-clock generator

Time interval measuring instrument

Phase difference measuring apparatus

Noise field intensity measuring apparatus

Average frequency measuring apparatus

Waveform display apparatus

Variable tuning device

Plural phase locked loop frequency synthesizer

DA Converter

Spectrum analyzer

Semiconductor memory device test apparatus

Semiconductor memory test pattern generating apparatus

Apparatus for measuring the oscillation frequency of a voltage cont...

Contact drive assembly for use with electronic part test equipment

Auto-calibrated D-A converter

Semiconductor memory test equipment

Reference voltage generator

A-D Converter with fine resolution

Stabilized sweep frequency generator with adjustable start and stop...

Variable current source

Self-compensating A-D converter

Logic test system permitting test pattern changes without dummy cycles