Tamar Technology Co.

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer measurement system and apparatus
- Patent number 7,738,113
- Issue date Jun 15, 2010
- Tamar Technology, Inc.
- David S. Marx
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench measurement system employing a chromatic confocal height sen...
- Patent number 7,477,401
- Issue date Jan 13, 2009
- Tamar Technology, Inc.
- David S. Marx
- G01 - MEASURING TESTING
Information Patent Grant
Low cost, high average power, high brightness solid state laser
- Patent number 5,434,875
- Issue date Jul 18, 1995
- Tamar Technology Co.
- Harry Rieger
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Trench measurement system employing a chromatic confocal height sen...
- Publication number 20060109483
- Publication date May 25, 2006
- Tamar Technology, Inc.
- David S. Marx
- G02 - OPTICS

Trademarklast 30 trademarks

Information Trademark
78599140 - OPTICAL STYLUS
- Serial number 78599140
- Filing date Mar 31, 2005
- Tamar Technology
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments