TAU-METRIX, INC.

Organization

Santa Clara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Contactless technique for evaluating a fabrication of a wafer
- Patent number 8,990,759
- Issue date Mar 24, 2015
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated photodiode for semiconductor substrates
- Patent number 8,872,297
- Issue date Oct 28, 2014
- tau-Metrix, Inc.
- Gary Steinbrueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated photodiode for semiconductor substrates
- Patent number 8,410,568
- Issue date Apr 2, 2013
- tau-Metrix, Inc.
- Gary Steinbrueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for evaluating a fabrication of a die or a wafer
- Patent number 8,344,745
- Issue date Jan 1, 2013
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
System and apparatus for using test structures inside of a chip dur...
- Patent number 7,736,916
- Issue date Jun 15, 2010
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Contactless technique for evaluating a fabrication of a wafer
- Patent number 7,730,434
- Issue date Jun 1, 2010
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
System for using test structures to evaluate a fabrication of a wafer
- Patent number 7,723,724
- Issue date May 25, 2010
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Intra-chip power and test signal generation for use with test struc...
- Patent number 7,605,597
- Issue date Oct 20, 2009
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Technique for evaluating a fabrication of a die and wafer
- Patent number 7,423,288
- Issue date Sep 9, 2008
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Intra-clip power and test signal generation for use with test struc...
- Patent number 7,339,388
- Issue date Mar 4, 2008
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
System and apparatus for using test structures inside of a chip dur...
- Patent number 7,256,055
- Issue date Aug 14, 2007
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING
Information Patent Grant
Technique for evaluating a fabrication of a die and wafer
- Patent number 7,220,990
- Issue date May 22, 2007
- tau-Metrix, Inc.
- Majid Aghababazadeh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED PHOTODIODE FOR SEMICONDUCTOR SUBSTRATES
- Publication number 20160104812
- Publication date Apr 14, 2016
- TAU-METRIX, INC.
- Gary Steinbrueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PHOTODIODE FOR SEMICONDUCTOR SUBSTRATES
- Publication number 20130334644
- Publication date Dec 19, 2013
- TAU-METRIX, INC.
- Gary Steinbrueck
- H01 - BASIC ELECTRIC ELEMENTS

TAU-METRIX, INC.

Organization

Patents Grantslast 30 patents

Contactless technique for evaluating a fabrication of a wafer

Integrated photodiode for semiconductor substrates

Integrated photodiode for semiconductor substrates

Test structures for evaluating a fabrication of a die or a wafer

System and apparatus for using test structures inside of a chip dur...

Contactless technique for evaluating a fabrication of a wafer

System for using test structures to evaluate a fabrication of a wafer

Intra-chip power and test signal generation for use with test struc...

Technique for evaluating a fabrication of a die and wafer

Intra-clip power and test signal generation for use with test struc...

System and apparatus for using test structures inside of a chip dur...

Technique for evaluating a fabrication of a die and wafer

Patents Applicationslast 30 patents

INTEGRATED PHOTODIODE FOR SEMICONDUCTOR SUBSTRATES

INTEGRATED PHOTODIODE FOR SEMICONDUCTOR SUBSTRATES

Trademarklast 30 trademarks