TREA

TECAT TECHNOLOGIES (SUZHOU) LIMITED

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  • SUZHOU CITY, CN
Organizations

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe and elastic structure thereof
    • Patent number 12,163,980
    • Issue date Dec 10, 2024
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 12,117,484
    • Issue date Oct 15, 2024
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor structure comprising heat dissipation member
    • Patent number 11,804,417
    • Issue date Oct 31, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Testing device and probe elements thereof
    • Patent number 11,768,223
    • Issue date Sep 26, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card device and testing equipment thereof
    • Patent number 11,761,984
    • Issue date Sep 19, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    High speed signal transmitting and receiving detection device
    • Patent number 11,567,104
    • Issue date Jan 31, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probing system
    • Patent number 11,549,968
    • Issue date Jan 10, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probing device
    • Patent number 11,293,975
    • Issue date Apr 5, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Shielding for probing system
    • Patent number 11,262,400
    • Issue date Mar 1, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong Lou
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    OPTICAL SIGNAL PROCESSING DEVICE AND OPTICAL SIGNAL MEASUREMENT METHOD
    • Publication number 20240430005
    • Publication date Dec 26, 2024
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong LOU
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST DEVICE
    • Publication number 20240036107
    • Publication date Feb 1, 2024
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD DEVICE AND TESTING EQUIPMENT THEREOF
    • Publication number 20230147867
    • Publication date May 11, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE AND PROBE CARD DEVICE
    • Publication number 20230036268
    • Publication date Feb 2, 2023
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD STRUCTURE
    • Publication number 20230025864
    • Publication date Jan 26, 2023
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
    • Publication number 20220397587
    • Publication date Dec 15, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING DEVICE AND PROBE ELEMENTS THEREOF
    • Publication number 20220390487
    • Publication date Dec 8, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE STRUCTURE AND PROBE CARD DEVICE
    • Publication number 20220341969
    • Publication date Oct 27, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBING SYSTEM
    • Publication number 20220221492
    • Publication date Jul 14, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE MODULE
    • Publication number 20220221490
    • Publication date Jul 14, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE
    • Publication number 20220221488
    • Publication date Jul 14, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD DEVICE
    • Publication number 20220221491
    • Publication date Jul 14, 2022
    • teCat Technologies (Suzhou) Limited
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR STRUCTURE
    • Publication number 20220199488
    • Publication date Jun 23, 2022
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • Choon Leong LOU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SHIELDING FOR PROBING SYSTEM
    • Publication number 20210311111
    • Publication date Oct 7, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD, PROBING SYSTEM AND PROBING METHOD
    • Publication number 20210208182
    • Publication date Jul 8, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBING DEVICE
    • Publication number 20210199711
    • Publication date Jul 1, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHOON LEONG LOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20210173003
    • Publication date Jun 10, 2021
    • TECAT TECHNOLOGIES (SUZHOU) LIMITED
    • CHANG-MING LIN
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks