TECHINSIGHTS (HOLDCO) LIMITED

Organization

LONDON, GB

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit imaging, rendering and layout editing system and...
- Patent number 11,593,545
- Issue date Feb 28, 2023
- Techinsights Inc.
- Dale Carlson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reverse engineering data analysis system, and integrated circuit co...
- Patent number 11,301,988
- Issue date Apr 12, 2022
- Techinsights Inc.
- Michael Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 11,214,874
- Issue date Jan 4, 2022
- Techinsights Inc.
- Robert K. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit imaging, rendering and layout editing system and...
- Patent number 11,074,389
- Issue date Jul 27, 2021
- Techinsights Inc.
- Dale Carlson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reverse engineering data analysis system, and integrated circuit co...
- Patent number 10,803,577
- Issue date Oct 13, 2020
- Techinsights Inc.
- Michael Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 10,689,763
- Issue date Jun 23, 2020
- Techinsights Inc.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 10,550,480
- Issue date Feb 4, 2020
- TECHINSIGHTS INC.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Integrated circuit imaging, rendering and layout editing system and...
- Patent number 10,489,545
- Issue date Nov 26, 2019
- TECHINSIGHTS INC.
- Dale Carlson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems and devices relating to distortion correction in i...
- Patent number 10,469,777
- Issue date Nov 5, 2019
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 9,534,299
- Issue date Jan 3, 2017
- Techinsights Inc.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,529,040
- Issue date Dec 27, 2016
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,383,327
- Issue date Jul 5, 2016
- TECHINSIGHTS INC.
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method of bibliographic field normalization
- Patent number 8,918,402
- Issue date Dec 23, 2014
- Techinsights Inc.
- Jason M. White
- G06 - COMPUTING CALCULATING COUNTING

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...
- Publication number 20230273256
- Publication date Aug 31, 2023
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IMAGE SEGMENTATION FROM SPARSE PARTICLE IMPIN...
- Publication number 20230196581
- Publication date Jun 22, 2023
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM E...
- Publication number 20220399179
- Publication date Dec 15, 2022
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, AND ENDPOINT MONITORING SYST...
- Publication number 20220122805
- Publication date Apr 21, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...
- Publication number 20220005669
- Publication date Jan 6, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...
- Publication number 20210357564
- Publication date Nov 18, 2021
- TECHINSIGHTS INC.
- Dale CARLSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE ENGINEERING DATA ANALYSIS SYSTEM, AND INTEGRATED CIRCUIT CO...
- Publication number 20210042902
- Publication date Feb 11, 2021
- TECHINSIGHTS INC.
- Michael Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20200318242
- Publication date Oct 8, 2020
- TECHINSIGHTS INC.
- Robert K. Foster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...
- Publication number 20200167517
- Publication date May 28, 2020
- TECHINSIGHTS INC.
- Dale CARLSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE ENGINEERING DATA ANALYSIS SYSTEM, AND INTEGRATED CIRCUIT CO...
- Publication number 20190206040
- Publication date Jul 4, 2019
- TECHINSIGHTS INC.
- Michael Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...
- Publication number 20180144081
- Publication date May 24, 2018
- TECHINSIGHTS INC.
- Dale CARLSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS AND DEVICES RELATING TO DISTORTION CORRECTION IN I...
- Publication number 20180054575
- Publication date Feb 22, 2018
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20170096741
- Publication date Apr 6, 2017
- TECHINSIGHTS INC.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20170089813
- Publication date Mar 30, 2017
- TECHINSIGHTS INC.
- Robert K. Foster
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160282287
- Publication date Sep 29, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160187419
- Publication date Jun 30, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
79364104 - TECH INSIGHTS
- Serial number 79364104
- Filing date Aug 22, 2022
- TechInsights Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86868610 - PROVING PATENT VALUE
- Serial number 86868610
- Registration number 5668033
- Filing date Jan 7, 2016
- TechInsights Inc.
- 35 - Advertising
Information Trademark
86545295 - CIRCUITVISION
- Serial number 86545295
- Registration number 5510651
- Filing date Feb 25, 2015
- TechInsights Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78282384 - PEONY BLOSSOM
- Serial number 78282384
- Registration number 2874798
- Filing date Aug 3, 2003
- TechInsight, Inc.
- 35 - Advertising

TECHINSIGHTS (HOLDCO) LIMITED

Organization

Patents Grantslast 30 patents

Integrated circuit imaging, rendering and layout editing system and...

Reverse engineering data analysis system, and integrated circuit co...

Method and system for ion beam delayering of a sample and control t...

Integrated circuit imaging, rendering and layout editing system and...

Reverse engineering data analysis system, and integrated circuit co...

Method and system for ion beam delayering of a sample and control t...

Method and system for ion beam delayering of a sample and control t...

Integrated circuit imaging, rendering and layout editing system and...

Methods, systems and devices relating to distortion correction in i...

Circuit tracing using a focused ion beam

Method and system for ion beam delayering of a sample and control t...

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Method of bibliographic field normalization

Patents Applicationslast 30 patents

CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...

SYSTEM AND METHOD FOR IMAGE SEGMENTATION FROM SPARSE PARTICLE IMPIN...

ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM E...

ION BEAM DELAYERING SYSTEM AND METHOD, AND ENDPOINT MONITORING SYST...

ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...

INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...

REVERSE ENGINEERING DATA ANALYSIS SYSTEM, AND INTEGRATED CIRCUIT CO...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...

REVERSE ENGINEERING DATA ANALYSIS SYSTEM, AND INTEGRATED CIRCUIT CO...

INTEGRATED CIRCUIT IMAGING, RENDERING AND LAYOUT EDITING SYSTEM AND...

METHODS, SYSTEMS AND DEVICES RELATING TO DISTORTION CORRECTION IN I...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

Trademarklast 30 trademarks

79364104 - TECH INSIGHTS

86868610 - PROVING PATENT VALUE

86545295 - CIRCUITVISION

78282384 - PEONY BLOSSOM