Technoprobe S.p.A.

Organization

Cernusco Lombardone, IT

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Testing head with an improved contact between contact probes and gu...
- Patent number 12,105,118
- Issue date Oct 1, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head with improved contact properties towards a devi...
- Patent number 12,085,588
- Issue date Sep 10, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for high-frequency applications with improved current...
- Patent number 12,044,703
- Issue date Jul 23, 2024
- Technoprobe S.p.A.
- Raffaele Vallauri
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a multi-layer for a probe card
- Patent number 12,019,111
- Issue date Jun 25, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for the automated assembly of a probe head
- Patent number 12,000,879
- Issue date Jun 4, 2024
- Technoprobe S.p.A.
- Roberto Subranni
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head having an improved contact with a device under...
- Patent number 11,867,723
- Issue date Jan 9, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with improved frequency property
- Patent number 11,828,774
- Issue date Nov 28, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for a testing apparatus of electronic devices
- Patent number 11,782,075
- Issue date Oct 10, 2023
- TECHNOPROBE S.P.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and corresponding testing head of an apparatus for te...
- Patent number 11,549,965
- Issue date Jan 10, 2023
- Technoprobe S.p.A.
- Daniele Perego
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high frequency applications
- Patent number 11,415,600
- Issue date Aug 16, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
High-performance probe card in high-frequency
- Patent number 11,402,428
- Issue date Aug 2, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing high-frequency devices
- Patent number 11,340,262
- Issue date May 24, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe head and corresponding contact probe
- Patent number 11,333,681
- Issue date May 17, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever contact probe and corresponding probe head
- Patent number 11,307,221
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing electronic devices
- Patent number 11,307,222
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Fabio Morgana
- G01 - MEASURING TESTING
Information Patent Grant
Interface element for a testing apparatus of electronic devices and...
- Patent number 11,293,941
- Issue date Apr 5, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for a testing apparatus of electronic devices
- Patent number 11,209,463
- Issue date Dec 28, 2021
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,163,004
- Issue date Nov 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for testing head
- Patent number 11,131,690
- Issue date Sep 28, 2021
- Technoprobe S.p.A.
- Giuseppe Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card for high-frequency applications
- Patent number 11,112,431
- Issue date Sep 7, 2021
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,035,885
- Issue date Jun 15, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high-frequency applications
- Patent number 11,029,336
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe testing head with improved frequency properties
- Patent number 11,029,337
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20240044940
- Publication date Feb 8, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20240027495
- Publication date Jan 25, 2024
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...
- Publication number 20240012025
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...
- Publication number 20240012028
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...
- Publication number 20240012027
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
LARGE PROBE HEAD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...
- Publication number 20230417798
- Publication date Dec 28, 2023
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...
- Publication number 20230408548
- Publication date Dec 21, 2023
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
- Publication number 20230324438
- Publication date Oct 12, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20230314476
- Publication date Oct 5, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...
- Publication number 20230305054
- Publication date Sep 28, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A PROBE HEAD
- Publication number 20230288447
- Publication date Sep 14, 2023
- TECHNOPROBE S.P.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...
- Publication number 20230028352
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
A TESTING HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND...
- Publication number 20230029150
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD FOR MANUFACTURING CONTACT PROBES FOR PROBE HEA...
- Publication number 20220155344
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Probe head for electronic devices and corresponding probe card
- Publication number 20220155348
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
Vertical Probe Head
- Publication number 20220155349
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES
- Publication number 20220099703
- Publication date Mar 31, 2022
- Technoprobe S.p.A.
- Riccardo LIBERINI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20220034966
- Publication date Feb 3, 2022
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD HAVING AN IMPROVED CONTACT WITH A DEVICE UNDER...
- Publication number 20210318355
- Publication date Oct 14, 2021
- Technoprobe S.p.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20210270869
- Publication date Sep 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD WITH IMPROVED CONTACT PROPERTIES TOWARDS A DEVI...
- Publication number 20210255218
- Publication date Aug 19, 2021
- Technoprobe S.p.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20210247422
- Publication date Aug 12, 2021
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR HIGH FREQUENCY APPLICATIONS
- Publication number 20210123950
- Publication date Apr 29, 2021
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PERFORMANCE PROBE CARD IN HIGH-FREQUENCY
- Publication number 20210063478
- Publication date Mar 4, 2021
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD FOR TESTING ELECTRONIC DEVICES
- Publication number 20200379009
- Publication date Dec 3, 2020
- Technoprobe S.p.A.
- Fabio MORGANA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THE AUTOMATED ASSEMBLY OF A PROBE HEAD
- Publication number 20200379015
- Publication date Dec 3, 2020
- Technoprobe S.p.A.
- Roberto SUBRANNI
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE HEAD AND CORRESPONDING CONTACT PROBE
- Publication number 20200348336
- Publication date Nov 5, 2020
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
88720526
- Serial number 88720526
- Registration number 6188359
- Filing date Dec 9, 2019
- TECHNOPROBE S.p.A.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88638165 - CAPACIBALL
- Serial number 88638165
- Registration number 6178000
- Filing date Oct 1, 2019
- TECHNOPROBE S.p.A.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79052447 - TECHNOPROBE
- Serial number 79052447
- Registration number 3547173
- Filing date Feb 19, 2008
- TECHNOPROBE S.p.A.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79042135 - ROUTE60
- Serial number 79042135
- Registration number 3527711
- Filing date Feb 23, 2007
- TECHNOPROBE S.p.A.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Technoprobe S.p.A.

Organization

Patents Grantslast 30 patents

Testing head with an improved contact between contact probes and gu...

Vertical probe head with improved contact properties towards a devi...

Contact probe for high-frequency applications with improved current...

Probe head for electronic devices and corresponding probe card

Manufacturing method of a multi-layer for a probe card

Apparatus for the automated assembly of a probe head

Probe head for a testing apparatus of electronic devices with enhan...

Probe head for reduced-pitch applications

Testing head having improved frequency properties

Vertical probe head having an improved contact with a device under...

Testing head with improved frequency property

Testing head having improved frequency properties

Probe card for a testing apparatus of electronic devices

Testing head having improved frequency properties

Contact probe and corresponding testing head of an apparatus for te...

Contact probe and relative probe head of an apparatus for testing e...

Probe card for high frequency applications

High-performance probe card in high-frequency

Contact probe for a testing head for testing high-frequency devices

Cantilever probe head and corresponding contact probe

Cantilever contact probe and corresponding probe head

Contact probe for a testing head for testing electronic devices

Interface element for a testing apparatus of electronic devices and...

Probe card for a testing apparatus of electronic devices

Probe head for a testing apparatus of electronic devices with enhan...

Contact probe for testing head

Probe card for high-frequency applications

Testing head having improved frequency properties

Probe card for high-frequency applications

Vertical probe testing head with improved frequency properties

Patents Applicationslast 30 patents

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...

LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...

PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...

LARGE PROBE HEAD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFAC...

FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...

CONTACT PROBE FOR A PROBE HEAD

CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...

A TESTING HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND...

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

MANUFACTURING METHOD FOR MANUFACTURING CONTACT PROBES FOR PROBE HEA...

Probe head for electronic devices and corresponding probe card

Vertical Probe Head

PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

VERTICAL PROBE HEAD HAVING AN IMPROVED CONTACT WITH A DEVICE UNDER...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

VERTICAL PROBE HEAD WITH IMPROVED CONTACT PROPERTIES TOWARDS A DEVI...

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

PROBE CARD FOR HIGH FREQUENCY APPLICATIONS

HIGH-PERFORMANCE PROBE CARD IN HIGH-FREQUENCY

CONTACT PROBE FOR A TESTING HEAD FOR TESTING ELECTRONIC DEVICES

APPARATUS AND METHOD FOR THE AUTOMATED ASSEMBLY OF A PROBE HEAD

CANTILEVER PROBE HEAD AND CORRESPONDING CONTACT PROBE

Trademarklast 30 trademarks

88720526

88638165 - CAPACIBALL

79052447 - TECHNOPROBE

79042135 - ROUTE60