TechWing., Co., Ltd.

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Yongin, KR

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Handler for testing semiconductor device and method for checking wh...
- Patent number 9,964,588
- Issue date May 8, 2018
- Techwing Co., Ltd.
- Sung Il Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Test handler and circulation method of test trays in test handler
- Patent number 9,958,498
- Issue date May 1, 2018
- Techwing Co., Ltd.
- Yun-Sung Na
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handler for testing semiconductor device with detecting sensors
- Patent number 9,343,342
- Issue date May 17, 2016
- Techwing Co., Ltd.
- Jin-Bok Lee
- G01 - MEASURING TESTING
Information Patent Grant
Pick and place apparatus for electronic device inspection equipment
- Patent number 8,926,259
- Issue date Jan 6, 2015
- TechWing., Co. Ltd
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Hi-fix board clamping apparatus for use in test handler
- Patent number 8,919,755
- Issue date Dec 30, 2014
- Techwing Co. Ltd.
- Jae Gyun Shim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Test handler and method for operating the same for testing semicond...
- Patent number 8,653,845
- Issue date Feb 18, 2014
- TechWing Co., Ltd
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Carrier board transfer system for handler that supports testing of...
- Patent number 8,570,058
- Issue date Oct 29, 2013
- TechWing Co., Ltd.
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Opener for test handler
- Patent number 8,558,569
- Issue date Oct 15, 2013
- TechWing Co., Ltd.
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Insert for carrier board of test handler
- Patent number 8,523,163
- Issue date Sep 3, 2013
- TechWing., Co. Ltd
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Opener and buffer table for test handler
- Patent number 8,523,158
- Issue date Sep 3, 2013
- TechWing., Co. Ltd
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Pick and place apparatus for electronic device inspection equipment...
- Patent number 8,496,426
- Issue date Jul 30, 2013
- TechWing., Co. Ltd
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Insert for carrier board of test handler
- Patent number 8,496,113
- Issue date Jul 30, 2013
- TechWing Co., Ltd.
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Pick-and-place module for test handler
- Patent number 8,376,431
- Issue date Feb 19, 2013
- TechWing Co., Ltd
- Yun Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
System to support testing of electronic devices, temperature contro...
- Patent number 8,333,083
- Issue date Dec 18, 2012
- TechWing Co., Ltd.
- Yun-Sung Na
- G05 - CONTROLLING REGULATING
Information Patent Grant
Unit for opening insert for test tray and method of mounting semico...
- Patent number 8,277,162
- Issue date Oct 2, 2012
- Techwing Co., Ltd.
- Yun Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Test tray for test handler
- Patent number 8,258,804
- Issue date Sep 4, 2012
- TechWing., Co. Ltd
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler and method for operating the same for testing semicond...
- Patent number 8,159,252
- Issue date Apr 17, 2012
- TechWing Co., Ltd
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Side-docking type test handler and apparatus for transferring test...
- Patent number 8,154,314
- Issue date Apr 10, 2012
- Techwing Co., Ltd.
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Pick-and-place module for test handlers
- Patent number 8,146,969
- Issue date Apr 3, 2012
- Techwing Co., Ltd.
- Dong Hyun Yo
- G01 - MEASURING TESTING
Information Patent Grant
Pick-and-place apparatus
- Patent number 8,141,922
- Issue date Mar 27, 2012
- TechWing Co., Ltd
- Jae-Gyun Shim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test Handler
- Patent number 8,058,890
- Issue date Nov 15, 2011
- TechWing Co., Ltd
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Pick and place apparatus
- Patent number 8,038,191
- Issue date Oct 18, 2011
- Techwing Co., Ltd.
- Jae Gyun Shim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test handler
- Patent number 8,026,735
- Issue date Sep 27, 2011
- TechWing Co. Ltd
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler and loading method thereof
- Patent number 8,013,620
- Issue date Sep 6, 2011
- TechWing Co. Ltd
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Pick and place apparatus
- Patent number 7,954,869
- Issue date Jun 7, 2011
- Techwing Co., Ltd.
- Jae Gyun Shim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test handler
- Patent number 7,948,255
- Issue date May 24, 2011
- TechWing Co., Ltd
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler
- Patent number 7,923,989
- Issue date Apr 12, 2011
- Techwing Co., Ltd.
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Position changing apparatus for test handler and power transferring...
- Patent number 7,898,271
- Issue date Mar 1, 2011
- TechWing., Co., Ltd.
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Grant
Operating method of test handler
- Patent number 7,876,117
- Issue date Jan 25, 2011
- TechWing., Co. Ltd
- Yun Sung Na
- G01 - MEASURING TESTING
Information Patent Grant
Test handler having size-changeable test site
- Patent number 7,816,910
- Issue date Oct 19, 2010
- Techwing Co., Ltd.
- Jae Gyun Shim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HANDLER FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20150270152
- Publication date Sep 24, 2015
- TECHWING CO., LTD.
- Jin-Bok LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Handler and Circulation Method of Test Trays in Test Handler
- Publication number 20150247895
- Publication date Sep 3, 2015
- TECHWING CO., LTD.
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Application
HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD FOR CHECKING WH...
- Publication number 20140313317
- Publication date Oct 23, 2014
- TECHWING CO., LTD.
- Sung Il KWON
- G01 - MEASURING TESTING
Information Patent Application
PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT...
- Publication number 20130230377
- Publication date Sep 5, 2013
- TechWing., Co. Ltd.
- Yun-Sung NA
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER AND METHOD FOR OPERATING THE SAME FOR TESTING SEMICOND...
- Publication number 20120056636
- Publication date Mar 8, 2012
- TECHWING CO., LTD.
- Jae Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
OPENER FOR TEST HANDLER
- Publication number 20110265316
- Publication date Nov 3, 2011
- TECHWING CO., LTD.
- Yun-Sung NA
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER
- Publication number 20110138934
- Publication date Jun 16, 2011
- TECHWING CO., LTD.
- Jae-Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT...
- Publication number 20110008144
- Publication date Jan 13, 2011
- TECHWING CO., LTD.
- Yun-Sung NA
- G01 - MEASURING TESTING
Information Patent Application
OPENER AND BUFFER TABLE FOR TEST HANDLER
- Publication number 20100320348
- Publication date Dec 23, 2010
- TechWing., CO. LTD
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Application
PICK-AND-PLACE MODULE FOR TEST HANDLER
- Publication number 20100316478
- Publication date Dec 16, 2010
- TECHWING CO., LTD.
- Yun Sung NA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BOARD TRANSFER SYSTEM FOR HANDLER THAT SUPPORTS TESTING OF...
- Publication number 20100303588
- Publication date Dec 2, 2010
- TechWing., CO. LTD
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Application
PICK-AND-PLACE MODULE FOR TEST HANDLERS
- Publication number 20100229660
- Publication date Sep 16, 2010
- TECHWING CO., LTD.
- Dong-Hyun YO
- G01 - MEASURING TESTING
Information Patent Application
OPERATING METHOD OF TEST HANDLER
- Publication number 20100134136
- Publication date Jun 3, 2010
- TECHWING CO., LTD.
- Yun Sung Na
- G01 - MEASURING TESTING
Information Patent Application
Test Handler and Loading Method Thereof
- Publication number 20100097089
- Publication date Apr 22, 2010
- TECHWING CO. LTD.
- Jae-Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE
- Publication number 20100019790
- Publication date Jan 28, 2010
- Techwing Co., Ltd.
- JAE GYUN SHIM
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR TEST HANDLER
- Publication number 20100001739
- Publication date Jan 7, 2010
- TECHWING., CO. LTD
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Application
PICK-AND-PLACE-APPRATUS
- Publication number 20090297301
- Publication date Dec 3, 2009
- TECHWING., CO. LTD
- Jae-Gyun Shim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNIT FOR OPENING INSERT FOR TEST TRAY AND METHOD OF MOUNTING SEMICO...
- Publication number 20090245982
- Publication date Oct 1, 2009
- TECHWING CO., LTD.
- Yun Sung NA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO SUPPORT TESTING OF ELECTRONIC DEVICES, TEMPERATURE CONTRO...
- Publication number 20090230201
- Publication date Sep 17, 2009
- TECHWING CO., LTD.
- Yun-Sung NA
- G05 - CONTROLLING REGULATING
Information Patent Application
SIDE-DOCKING TYPE TEST HANDLER AND APPARATUS FOR TRANSFERRING TEST...
- Publication number 20090199395
- Publication date Aug 13, 2009
- TECHWING CO., LTD.
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Application
INSERT FOR CARRIER BOARD OF TEST HANDLER
- Publication number 20090196719
- Publication date Aug 6, 2009
- TECHWING CO., LTD.
- Yun-Sung Na
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TRANSFERRING TEST TRAYS IN A SIDE-DOCKING TYPE TEST HANDLER
- Publication number 20090153178
- Publication date Jun 18, 2009
- TECHWING CO., LTD.
- Jae Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
Test Handler
- Publication number 20090148257
- Publication date Jun 11, 2009
- TECHWING CO. LTD.
- Jae-Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
Test Handler
- Publication number 20080298946
- Publication date Dec 4, 2008
- TECHWING CO., LTD.
- Jae-Gyun Shim
- G01 - MEASURING TESTING
Information Patent Application
Pick and Place Apparatus
- Publication number 20080284186
- Publication date Nov 20, 2008
- TECHWING CO., LTD.
- Jae Gyun Shim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST TRAY FOR TEST HANDLER
- Publication number 20080272764
- Publication date Nov 6, 2008
- TECHWING CO., LTD.
- Jae Gyun Shim
- G01 - MEASURING TESTING
Information Patent Application
TEST HANDLER
- Publication number 20080265874
- Publication date Oct 30, 2008
- TECHWING CO., LTD.
- Jae Gyun SHIM
- G01 - MEASURING TESTING
Information Patent Application
INSERT FOR CARRIER BOARD OF TEST HANDLER
- Publication number 20080253869
- Publication date Oct 16, 2008
- TECHWING CO., LTD.
- Na Yun Sung
- G01 - MEASURING TESTING
Information Patent Application
OPERATING METHOD OF TEST HANDLER
- Publication number 20080238470
- Publication date Oct 2, 2008
- TECHWING CO., LTD.
- Yun Sung Na
- G01 - MEASURING TESTING
Information Patent Application
PUSHER FOR MATCH PLATE OF TEST HANDLER
- Publication number 20080231260
- Publication date Sep 25, 2008
- TECHWING CO., LTD.
- Yun Sung Na
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
85830315 - TECHWING
- Serial number 85830315
- Registration number 4413787
- Filing date Jan 23, 2013
- Techwing Co., Ltd.
- 7 - Machines and machine tools

TechWing., Co., Ltd.

Organization

Patents Grantslast 30 patents

Handler for testing semiconductor device and method for checking wh...

Test handler and circulation method of test trays in test handler

Handler for testing semiconductor device with detecting sensors

Pick and place apparatus for electronic device inspection equipment

Hi-fix board clamping apparatus for use in test handler

Test handler and method for operating the same for testing semicond...

Carrier board transfer system for handler that supports testing of...

Opener for test handler

Insert for carrier board of test handler

Opener and buffer table for test handler

Pick and place apparatus for electronic device inspection equipment...

Insert for carrier board of test handler

Pick-and-place module for test handler

System to support testing of electronic devices, temperature contro...

Unit for opening insert for test tray and method of mounting semico...

Test tray for test handler

Test handler and method for operating the same for testing semicond...

Side-docking type test handler and apparatus for transferring test...

Pick-and-place module for test handlers

Pick-and-place apparatus

Test Handler

Pick and place apparatus

Test handler

Test handler and loading method thereof

Pick and place apparatus

Test handler

Test handler

Position changing apparatus for test handler and power transferring...

Operating method of test handler

Test handler having size-changeable test site

Patents Applicationslast 30 patents

HANDLER FOR TESTING SEMICONDUCTOR DEVICE

Test Handler and Circulation Method of Test Trays in Test Handler

HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD FOR CHECKING WH...

PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT...

TEST HANDLER AND METHOD FOR OPERATING THE SAME FOR TESTING SEMICOND...

OPENER FOR TEST HANDLER

TEST HANDLER

PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT...

OPENER AND BUFFER TABLE FOR TEST HANDLER

PICK-AND-PLACE MODULE FOR TEST HANDLER

CARRIER BOARD TRANSFER SYSTEM FOR HANDLER THAT SUPPORTS TESTING OF...

PICK-AND-PLACE MODULE FOR TEST HANDLERS

OPERATING METHOD OF TEST HANDLER

Test Handler and Loading Method Thereof

TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE

TEST TRAY FOR TEST HANDLER

PICK-AND-PLACE-APPRATUS

UNIT FOR OPENING INSERT FOR TEST TRAY AND METHOD OF MOUNTING SEMICO...

SYSTEM TO SUPPORT TESTING OF ELECTRONIC DEVICES, TEMPERATURE CONTRO...

SIDE-DOCKING TYPE TEST HANDLER AND APPARATUS FOR TRANSFERRING TEST...

INSERT FOR CARRIER BOARD OF TEST HANDLER

METHOD FOR TRANSFERRING TEST TRAYS IN A SIDE-DOCKING TYPE TEST HANDLER

Test Handler

Test Handler

Pick and Place Apparatus

TEST TRAY FOR TEST HANDLER

TEST HANDLER

INSERT FOR CARRIER BOARD OF TEST HANDLER

OPERATING METHOD OF TEST HANDLER

PUSHER FOR MATCH PLATE OF TEST HANDLER

Trademarklast 30 trademarks

85830315 - TECHWING