TERAVIEW LIMITED

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LOS ANGELES, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test system
- Patent number 11,921,154
- Issue date Mar 5, 2024
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 11,885,610
- Issue date Jan 30, 2024
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,726,136
- Issue date Aug 15, 2023
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system for testing the integrity of an electronic device
- Patent number 11,366,158
- Issue date Jun 21, 2022
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,169,202
- Issue date Nov 9, 2021
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 11,085,755
- Issue date Aug 10, 2021
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Transmission line
- Patent number 10,845,411
- Issue date Nov 24, 2020
- TeraView Limited
- Ka Chung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 10,076,261
- Issue date Sep 18, 2018
- TeraView Limited
- Donald Dominic Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test system
- Patent number 10,006,960
- Issue date Jun 26, 2018
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Imaging techniques and associated apparatus
- Patent number 9,829,433
- Issue date Nov 28, 2017
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and method
- Patent number 9,201,052
- Issue date Dec 1, 2015
- TeraView Limited
- Louise Ho
- G01 - MEASURING TESTING
Information Patent Grant
TeraHertz probe array imaging system
- Patent number 9,075,002
- Issue date Jul 7, 2015
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Scanning terahertz probe
- Patent number 9,006,660
- Issue date Apr 14, 2015
- TeraView Limited
- Bryan Edward Cole
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for investigating a non-planar sample
- Patent number 8,665,423
- Issue date Mar 4, 2014
- TeraView Limited
- Michael J. Withers
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz investigative system and method
- Patent number 8,399,838
- Issue date Mar 19, 2013
- TeraView Limited
- Michael John Evans
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating a sample
- Patent number 8,373,126
- Issue date Feb 12, 2013
- TeraView Limited
- Julian A. Cluff
- G01 - MEASURING TESTING
Information Patent Grant
THz investigation apparatus and method
- Patent number 8,138,477
- Issue date Mar 20, 2012
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Radiation probe and detecting tooth decay
- Patent number 8,027,709
- Issue date Sep 27, 2011
- TeraView Limited
- Donald Dominic Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Imaging apparatus and method
- Patent number 7,804,069
- Issue date Sep 28, 2010
- TeraView Limited
- William R. Tribe
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating a sample
- Patent number 7,777,187
- Issue date Aug 17, 2010
- TeraView Limited
- Julian A. Cluff
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for varying the path length of a beam of radiation
- Patent number 7,742,172
- Issue date Jun 22, 2010
- TeraView Limited
- Julian A. Cluff
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopy apparatus and associated technique
- Patent number 7,728,296
- Issue date Jun 1, 2010
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for terahertz imaging
- Patent number 7,693,571
- Issue date Apr 6, 2010
- TeraView Limited
- Donald D Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Reducing scattering related features in terhertz time domain spectr...
- Patent number 7,675,036
- Issue date Mar 9, 2010
- TeraView Limited
- Philip F. Taday
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for quantitative analysis using terahertz radi...
- Patent number 7,663,107
- Issue date Feb 16, 2010
- TeraView Limited
- Philip F. Taday
- G01 - MEASURING TESTING
Information Patent Grant
Image of sample using terahertz time domain spectroscopy in reflect...
- Patent number 7,612,341
- Issue date Nov 3, 2009
- TeraView Limited
- Anthony J. Fitzgerald
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electrodes on a photoconductive substrate for generation and detect...
- Patent number 7,609,208
- Issue date Oct 27, 2009
- TeraView Limited
- Michael J. Evans
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for investigating a sample
- Patent number 7,485,863
- Issue date Feb 3, 2009
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Coherent THz emitter with DC power reducing resistor
- Patent number 7,397,428
- Issue date Jul 8, 2008
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method of enhancing the photoconductive properties of a semiconductor
- Patent number 7,364,993
- Issue date Apr 29, 2008
- TeraView Limited
- Michael J. Evans
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
CURVATURE CORRECTION
- Publication number 20240328781
- Publication date Oct 3, 2024
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20240192270
- Publication date Jun 13, 2024
- Teraview Limited
- Brian Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20240167810
- Publication date May 23, 2024
- Teraview Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20230324452
- Publication date Oct 12, 2023
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220268833
- Publication date Aug 25, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220026482
- Publication date Jan 27, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20210310796
- Publication date Oct 7, 2021
- Teraview Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING COATING THICKNESS
- Publication number 20190383599
- Publication date Dec 19, 2019
- TERAVIEW LIMITED
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Application
A TRANSMISSION LINE
- Publication number 20190072609
- Publication date Mar 7, 2019
- Teraview Limited
- Ka Chung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A TEST SYSTEM
- Publication number 20180364301
- Publication date Dec 20, 2018
- TERAVIEW LIMITED
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20180275190
- Publication date Sep 27, 2018
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20140021963
- Publication date Jan 23, 2014
- TERAVIEW LIMITED
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for quantitative analysis using terahertz radi...
- Publication number 20060237650
- Publication date Oct 26, 2006
- Teraview Limited
- Philip Francis Taday
- G01 - MEASURING TESTING
Information Patent Application
Terahertz quantum cascade laser
- Publication number 20060153262
- Publication date Jul 13, 2006
- Teraview Limited
- Stefano Barbieri
- B82 - NANO-TECHNOLOGY
Information Patent Application
Radiation probe and detecting tooth decay
- Publication number 20050100866
- Publication date May 12, 2005
- TeraView Limited
- Donald Dominic Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Trademarklast 30 trademarks

Information Trademark
76177334 - TERAVIEW
- Serial number 76177334
- Registration number 3169027
- Filing date Dec 7, 2000
- Toshiba Research Europe Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76177293 - TPI
- Serial number 76177293
- Registration number 3261369
- Filing date Dec 7, 2000
- Toshiba Research Europe Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

TERAVIEW LIMITED

Organization

Patents Grantslast 30 patents

Test system

Method and system for measuring coating thickness

Test system

Test system for testing the integrity of an electronic device

Test system

Method and system for measuring coating thickness

Transmission line

Imaging apparatus and method

Test system

Imaging techniques and associated apparatus

Analysis apparatus and method

TeraHertz probe array imaging system

Scanning terahertz probe

Method and apparatus for investigating a non-planar sample

Terahertz investigative system and method

Apparatus and method for investigating a sample

THz investigation apparatus and method

Radiation probe and detecting tooth decay

Imaging apparatus and method

Apparatus and method for investigating a sample

Apparatus for varying the path length of a beam of radiation

Spectroscopy apparatus and associated technique

Method and apparatus for terahertz imaging

Reducing scattering related features in terhertz time domain spectr...

Method and apparatus for quantitative analysis using terahertz radi...

Image of sample using terahertz time domain spectroscopy in reflect...

Electrodes on a photoconductive substrate for generation and detect...

Method and apparatus for investigating a sample

Coherent THz emitter with DC power reducing resistor

Method of enhancing the photoconductive properties of a semiconductor

Patents Applicationslast 30 patents

CURVATURE CORRECTION

TEST SYSTEM

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

TEST SYSTEM

TEST SYSTEM

TEST SYSTEM

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

METHOD AND SYSTEM FOR MEASURING COATING THICKNESS

A TRANSMISSION LINE

A TEST SYSTEM

TEST SYSTEM

TEST SYSTEM

Method and apparatus for quantitative analysis using terahertz radi...

Terahertz quantum cascade laser

Radiation probe and detecting tooth decay

Trademarklast 30 trademarks

76177334 - TERAVIEW

76177293 - TPI