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Tempe, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
8,041,541
Issue date
Oct 18, 2011
Test Advantage, Inc.
Paul M. Buxton
G05 - CONTROLLING REGULATING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
8,000,928
Issue date
Aug 16, 2011
Test Advantage, Inc.
Michael J. Scott
G05 - CONTROLLING REGULATING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,904,279
Issue date
Mar 8, 2011
Test Advantage, Inc.
Emilio Miguelanez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,437,271
Issue date
Oct 14, 2008
Test Advantage, Inc.
Eric Paul Tabor
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,395,170
Issue date
Jul 1, 2008
Test Advantage, Inc.
Michael J. Scott
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,356,430
Issue date
Apr 8, 2008
Test Advantage, Inc.
Emilio Miguelanez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,225,107
Issue date
May 29, 2007
Test Advantage, Inc.
Paul M. Buxton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for data analysis
Patent number
7,167,811
Issue date
Jan 23, 2007
Test Advantage, Inc.
Eric Paul Tabor
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for semiconductor testing
Patent number
6,792,373
Issue date
Sep 14, 2004
Test Advantage, Inc.
Eric Paul Tabor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for statistical process control of test
Patent number
6,442,499
Issue date
Aug 27, 2002
Test Advantage, Inc.
Jacky Gorin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
Publication number
20110178967
Publication date
Jul 21, 2011
Test Advantage, Inc.
Deana Delp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR HYBRID OUTLIER DETECTION
Publication number
20100036637
Publication date
Feb 11, 2010
Test Advantage, Inc.
Emilio Miguelanez
G01 - MEASURING TESTING
Trademark
last 30 trademarks