Test Research, Inc.

Organization

Taipei, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
System and method of testing single DUT through multiple cores in p...
- Patent number 11,686,768
- Issue date Jun 27, 2023
- Test Research, Inc.
- Ching-Chih Lin
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method of operating the same
- Patent number 11,067,623
- Issue date Jul 20, 2021
- Test Research, Inc.
- Ming-Hsien Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for three-dimensional inspection
- Patent number 10,841,561
- Issue date Nov 17, 2020
- Test Research, Inc.
- Wen-Tzong Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus
- Patent number 10,600,174
- Issue date Mar 24, 2020
- Test Research, Inc.
- Yeong-Feng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic optical inspection system and operating method thereof
- Patent number 10,438,340
- Issue date Oct 8, 2019
- Test Research, Inc.
- Kuang-Pu Wen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-chassis test device and test signal transmission apparatus of...
- Patent number 10,156,606
- Issue date Dec 18, 2018
- Test Research, Inc.
- Yu-Chen Shen
- G01 - MEASURING TESTING
Information Patent Grant
Test device and alternating current power detection method of the same
- Patent number 10,139,454
- Issue date Nov 27, 2018
- Test Research, Inc.
- Hsin-Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system
- Patent number 9,885,561
- Issue date Feb 6, 2018
- Test Research, Inc.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and device
- Patent number 9,841,387
- Issue date Dec 12, 2017
- Test Research, Inc.
- Liang-Pin Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting device and method for inspecting inspection target
- Patent number 9,838,612
- Issue date Dec 5, 2017
- Test Research, Inc.
- Yeong-Feng Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection system and method for controlling the same
- Patent number 9,791,387
- Issue date Oct 17, 2017
- Test Research, Inc.
- Yu-Che Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and image compensating method of optical apparatus
- Patent number 9,686,517
- Issue date Jun 20, 2017
- Test Research, Inc.
- Liang-Pin Yu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Testing apparatus for providing per pin level setting
- Patent number 9,562,947
- Issue date Feb 7, 2017
- Test Research, Inc.
- Hsin-Hao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optical system
- Patent number 9,485,491
- Issue date Nov 1, 2016
- Test Research, Inc.
- Liang-Pin Yu
- G02 - OPTICS
Information Patent Grant
Board-warping measuring apparatus and board-warping measuring metho...
- Patent number 9,423,242
- Issue date Aug 23, 2016
- Test Research, Inc.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement system
- Patent number 9,423,246
- Issue date Aug 23, 2016
- Test Research, Inc.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system for a 3D object
- Patent number 9,420,235
- Issue date Aug 16, 2016
- Test Research, Inc.
- Kuang-Pu Wen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing apparatus with backdriving protection function
- Patent number 9,140,755
- Issue date Sep 22, 2015
- Test Research, Inc.
- Po-Shen Kuo
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Three-dimensional image measuring apparatus
- Patent number 9,019,351
- Issue date Apr 28, 2015
- Test Research Inc.
- Liang-Pin Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for performing timing analysis
- Patent number 9,015,541
- Issue date Apr 21, 2015
- Test Research, Inc.
- Yu-Chen Shen
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection defect simulation test method and system of t...
- Patent number 8,843,357
- Issue date Sep 23, 2014
- TEST Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Signal transition detection circuit and method of the same
- Patent number 8,767,900
- Issue date Jul 1, 2014
- Test Research, Inc.
- Yu-Chen Shen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electrical connection defect detection system and method
- Patent number 8,350,575
- Issue date Jan 8, 2013
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection defect detection device
- Patent number 8,324,908
- Issue date Dec 4, 2012
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing printed circuit and method therefor
- Patent number 8,179,143
- Issue date May 15, 2012
- Test Research, Inc.
- Shang-Tsang Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Method for thickness calibration and measuring thickness of material
- Patent number 8,077,827
- Issue date Dec 13, 2011
- Test Research, Inc.
- Ming-Hwei Perng
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing system and method
- Patent number 7,855,567
- Issue date Dec 21, 2010
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing system and method
- Patent number 7,702,982
- Issue date Apr 20, 2010
- Test Research, Inc.
- Chia-Ming Chen
- G01 - MEASURING TESTING
Information Patent Grant
Open-circuit testing system and method
- Patent number 7,612,568
- Issue date Nov 3, 2009
- Test Research, Inc.
- Chien-Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for laminography inspection
- Patent number 7,529,336
- Issue date May 5, 2009
- Test Research, Inc.
- Kuang Pu Wen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF TESTING SINGLE DUT THROUGH MULTIPLE CORES IN P...
- Publication number 20220308109
- Publication date Sep 29, 2022
- Test Research, Inc.
- Ching-Chih LIN
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20200363465
- Publication date Nov 19, 2020
- Test Research, Inc.
- Ming-Hsien LIU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20180276811
- Publication date Sep 27, 2018
- Test Research, Inc.
- Kuang-Pu WEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR THREE-DIMENSIONAL INSPECTION
- Publication number 20180278911
- Publication date Sep 27, 2018
- Test Research, Inc.
- Wen-Tzong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICE AND ALTERNATING CURRENT POWER DETECTION METHOD OF THE SAME
- Publication number 20170205471
- Publication date Jul 20, 2017
- Test Research, Inc.
- Hsin-Wei HUANG
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND ALTERNATING CURRENT POWER DETECTION METHOD OF THE SAME
- Publication number 20170205449
- Publication date Jul 20, 2017
- Test Research, Inc.
- Cheng-Hung Kao
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHASSIS TEST DEVICE AND TEST SIGNAL TRANSMISSION APPARATUS OF...
- Publication number 20170192056
- Publication date Jul 6, 2017
- Test Research, Inc.
- Yu-Chen SHEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20170186150
- Publication date Jun 29, 2017
- Test Research, Inc.
- Yeong-Feng Wang
- G02 - OPTICS
Information Patent Application
INSPECTION METHOD AND DEVICE
- Publication number 20170023494
- Publication date Jan 26, 2017
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE AND METHOD FOR INSPECTING INSPECTION TARGET
- Publication number 20170019578
- Publication date Jan 19, 2017
- Test Research, Inc.
- Yeong-Feng WANG
- G01 - MEASURING TESTING
Information Patent Application
BOARD-WARPING MEASURING APPARATUS AND BOARD-WARPING MEASURING METHO...
- Publication number 20160209206
- Publication date Jul 21, 2016
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND IMAGE COMPENSATING METHOD OF OPTICAL APPARATUS
- Publication number 20160173836
- Publication date Jun 16, 2016
- Test Research, Inc.
- Liang-Pin YU
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM
- Publication number 20160173853
- Publication date Jun 16, 2016
- Test Research, Inc.
- Liang-Pin YU
- G02 - OPTICS
Information Patent Application
OPTICAL INSPECTION SYSTEM
- Publication number 20160169812
- Publication date Jun 16, 2016
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR CONTROLLING THE SAME
- Publication number 20160091441
- Publication date Mar 31, 2016
- Test Research, Inc.
- Yu-Che CHENG
- G01 - MEASURING TESTING
Information Patent Application
FIXTURE, SYSTEM AND METHOD FOR PERFORMING FUNCTIONAL TEST
- Publication number 20140225633
- Publication date Aug 14, 2014
- Test Research, Inc.
- Su-Wei TSAI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR PERFORMING TIMING ANALYSIS
- Publication number 20140201581
- Publication date Jul 17, 2014
- Test Research, Inc.
- Yu-Chen SHEN
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL IMAGE MEASURING APPARATUS
- Publication number 20140022357
- Publication date Jan 23, 2014
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM
- Publication number 20140009580
- Publication date Jan 9, 2014
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREM...
- Publication number 20130278723
- Publication date Oct 24, 2013
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TRANSITION DETECTION CIRCUIT AND METHOD OF THE SAME
- Publication number 20130223493
- Publication date Aug 29, 2013
- Test Research, Inc.
- Yu-Chen Shen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRICAL CONNECTION DEFECT SIMULATION TEST METHOD AND SYSTEM OF T...
- Publication number 20120173214
- Publication date Jul 5, 2012
- Test Research, Inc.
- Su-Wei Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISCHARGE DEVICE AND TEST SYSTEM HAVING THE SAME
- Publication number 20120161779
- Publication date Jun 28, 2012
- Test Research, Inc.
- Jiau-Cheng Shiau
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THICKNESS CALIBRATION AND MEASURING THICKNESS OF MATERIAL
- Publication number 20110206182
- Publication date Aug 25, 2011
- Test Research, Inc.
- Ming-Hwei PERNG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR
- Publication number 20100090679
- Publication date Apr 15, 2010
- Test Research, Inc
- Shang-Tsang YEH
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Testing System and Method
- Publication number 20090243642
- Publication date Oct 1, 2009
- Test Research, Inc.
- Su-Wei Tsai
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Testing System and Method
- Publication number 20090089635
- Publication date Apr 2, 2009
- Test Research, Inc.
- Chia-Ming Chen
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Laminography Inspection
- Publication number 20080298538
- Publication date Dec 4, 2008
- Test Research, Inc.
- Kuang Pu Wen
- G01 - MEASURING TESTING
Information Patent Application
Open-Circuit Testing System and Method
- Publication number 20080218175
- Publication date Sep 11, 2008
- Test Research, Inc.
- Chien-Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
Optical-enhanced apparatus and method for illuminating printed circ...
- Publication number 20040150714
- Publication date Aug 5, 2004
- Test Research, Inc.
- Don Lin
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
86940440 - OMNI COLOR
- Serial number 86940440
- Registration number 5273911
- Filing date Mar 15, 2016
- TEST RESEARCH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86547005 - TRI INNOVATION
- Serial number 86547005
- Registration number 4822114
- Filing date Feb 26, 2015
- TEST RESEARCH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77598851 - TOGGLESCAN
- Serial number 77598851
- Registration number 4002801
- Filing date Oct 23, 2008
- TEST RESEARCH, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
77598994 - VREGTEST
- Serial number 77598994
- Registration number 4006544
- Filing date Oct 23, 2008
- TEST RESEARCH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77383114 - TOGGLESCAN
- Serial number 77383114
- Registration number 3958101
- Filing date Jan 29, 2008
- TEST RESEARCH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77164488 - TRI INNOVATION
- Serial number 77164488
- Registration number 3534765
- Filing date Apr 24, 2007
- TEST RESEARCH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Test Research, Inc.

Organization

Patents Grantslast 30 patents

System and method of testing single DUT through multiple cores in p...

Test system and method of operating the same

Apparatus and method for three-dimensional inspection

Optical inspection apparatus

Automatic optical inspection system and operating method thereof

Multi-chassis test device and test signal transmission apparatus of...

Test device and alternating current power detection method of the same

Optical inspection system

Inspection method and device

Inspecting device and method for inspecting inspection target

Inspection system and method for controlling the same

Optical system and image compensating method of optical apparatus

Testing apparatus for providing per pin level setting

Optical system

Board-warping measuring apparatus and board-warping measuring metho...

Three-dimensional measurement system

Measuring system for a 3D object

Testing apparatus with backdriving protection function

Three-dimensional image measuring apparatus

Device and method for performing timing analysis

Electrical connection defect simulation test method and system of t...

Signal transition detection circuit and method of the same

Electrical connection defect detection system and method

Electrical connection defect detection device

Apparatus for testing printed circuit and method therefor

Method for thickness calibration and measuring thickness of material

Electronic device testing system and method

Electronic device testing system and method

Open-circuit testing system and method

System and method for laminography inspection

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF TESTING SINGLE DUT THROUGH MULTIPLE CORES IN P...

TEST SYSTEM AND METHOD OF OPERATING THE SAME

AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF

APPARATUS AND METHOD FOR THREE-DIMENSIONAL INSPECTION

TEST DEVICE AND ALTERNATING CURRENT POWER DETECTION METHOD OF THE SAME

TEST DEVICE AND ALTERNATING CURRENT POWER DETECTION METHOD OF THE SAME

MULTI-CHASSIS TEST DEVICE AND TEST SIGNAL TRANSMISSION APPARATUS OF...

OPTICAL INSPECTION APPARATUS

INSPECTION METHOD AND DEVICE

INSPECTING DEVICE AND METHOD FOR INSPECTING INSPECTION TARGET

BOARD-WARPING MEASURING APPARATUS AND BOARD-WARPING MEASURING METHO...

OPTICAL SYSTEM AND IMAGE COMPENSATING METHOD OF OPTICAL APPARATUS

OPTICAL SYSTEM

OPTICAL INSPECTION SYSTEM

INSPECTION SYSTEM AND METHOD FOR CONTROLLING THE SAME

FIXTURE, SYSTEM AND METHOD FOR PERFORMING FUNCTIONAL TEST

DEVICE AND METHOD FOR PERFORMING TIMING ANALYSIS

THREE-DIMENSIONAL IMAGE MEASURING APPARATUS

THREE-DIMENSIONAL MEASUREMENT SYSTEM

THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREM...

SIGNAL TRANSITION DETECTION CIRCUIT AND METHOD OF THE SAME

ELECTRICAL CONNECTION DEFECT SIMULATION TEST METHOD AND SYSTEM OF T...

DISCHARGE DEVICE AND TEST SYSTEM HAVING THE SAME

METHOD FOR THICKNESS CALIBRATION AND MEASURING THICKNESS OF MATERIAL

APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR

Electronic Device Testing System and Method

Electronic Device Testing System and Method

System and Method for Laminography Inspection

Open-Circuit Testing System and Method

Optical-enhanced apparatus and method for illuminating printed circ...

Trademarklast 30 trademarks

86940440 - OMNI COLOR

86547005 - TRI INNOVATION

77598851 - TOGGLESCAN

77598994 - VREGTEST

77383114 - TOGGLESCAN

77164488 - TRI INNOVATION