Test21 Taiwan Co., Ltd.

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing apparatus for wafer probing testing and final...
- Patent number 11,835,574
- Issue date Dec 5, 2023
- TEST21 TAIWAN CORPORATION
- Shun-Bon Ho
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for controlling IC temperature
- Patent number 9,841,459
- Issue date Dec 12, 2017
- Test21 Taiwan Co., Ltd.
- Shun-Bon Ho
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING APPARATUS WITH ADAPTOR
- Publication number 20230024045
- Publication date Jan 26, 2023
- TEST21 TAIWAN CORPORATION
- Shun-Bon HO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS FOR WAFER PROBING TESTING AND FINAL...
- Publication number 20220291279
- Publication date Sep 15, 2022
- TEST21 TAIWAN CORPORATION
- Shun-Bon HO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR CONTROLLING IC TEMPERATURE
- Publication number 20170115339
- Publication date Apr 27, 2017
- TEST21 TAIWAN CO.,Ltd
- SHUN-BON HO
- G01 - MEASURING TESTING

Trademarklast 30 trademarks