TEVET PROCESS CONTROL TECHNOLOGIES LTD

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YOKUEAN MOSHAVA 20600, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for thickness decomposition of complicated lay...
- Patent number 6,885,467
- Issue date Apr 26, 2005
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring lateral variations in thickness...
- Patent number 6,801,321
- Issue date Oct 5, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for production line screening
- Patent number 6,762,838
- Issue date Jul 13, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring stress in semiconductor wafers
- Patent number 6,678,055
- Issue date Jan 13, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for thickness decomposition of complicated lay...
- Publication number 20040080761
- Publication date Apr 29, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring stress in semiconductor wafers
- Publication number 20030098704
- Publication date May 29, 2003
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for production line screening
- Publication number 20030002032
- Publication date Jan 2, 2003
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING

Trademarklast 30 trademarks