Washington, DC, US
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The United States of America, as represented by the Secretary of Commerce, NIST
Jabez J. McClelland
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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The United States of America, as represented by the Secretary of Commerce, NIST
Steven Cundiff
G02 - OPTICS
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The United States of America, as represented by the Secretary of Commerce, NIST
David F. Plusquellic
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce, NIST
Angela R. Hight-Walker
B82 - NANO-TECHNOLOGY
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The United States of America, as represented by the Secretary of Commerce, NIST
Adam V. Steele
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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The United States of America as represented by the Secretary of Commerce, NIST
Brenton J. Knuffman
G01 - MEASURING TESTING
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The United States of America as represented by the Secretary of Commerce, NIST
Zachary H. Levine
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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The United States of America as represented by the Secretary of Commerce, NIST
John Lawall
G01 - MEASURING TESTING
