Washington, DC, US
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PSIQUANTUM CORP.
Faraz Najafi
H01 - BASIC ELECTRIC ELEMENTS
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University of Maryland, College Park
Ivan A. Burenkov
G02 - OPTICS
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The USA, as represented by the Secretary, Dept. of Health and Human Services
Gary Zabow
B82 - NANO-TECHNOLOGY
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GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Michael A. Lombardi
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Sergey V. Polyakov
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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The United States of America, as represented by the Secretary of Commerce
Young Jong Lee
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Eric A. Lass
B22 - CASTING POWDER METALLURGY
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The United States of America, as represented by the Secretary of Commerce
Terrence J. Jach
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of Commerce
David P. Pappas
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of Commerce
J. Alexander Liddle
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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The United States of America, as represented by the Secretary of Commerce
Vladimir Aksyuk
G02 - OPTICS
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The Trustees of Columbia University In the City of New York
Jingyue Ju
B82 - NANO-TECHNOLOGY
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The United States of America, as represented by the Secretary of Commerce
Vladimir A. Aksyuk
B82 - NANO-TECHNOLOGY
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The United States of America, as represented by the Secretary of Commerce
Christopher M. Smith
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Kuldeep Prasad
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Kin P. Cheung
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Adam McCaughan
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of Commerce
Alexandra Artusio-Glimpse
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Gregory B Rieker
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary, Department of...
Gary Zabow
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America, as represented by the Secretary, Department of...
Gary Zabow
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America, as represented by the Secretary, Department of...
Gary Zabow
B82 - NANO-TECHNOLOGY
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Patent Grant
The United States of America, as represented by the Secretary of Commerce
Christopher M. Smith
G01 - MEASURING TESTING
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The United States of America, as represented by the Secretary of Commerce
Vladimir A. Aksyuk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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The United States of America, as represented by the Secretary of Commerce
John T. Woodward
G02 - OPTICS
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The United States of America, as represented by the Secretary of Commerce
Zeeshan Ahmed
G02 - OPTICS
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The United States of America, as represented by the Secretary of Commerce
Yaw S. Obeng
G06 - COMPUTING CALCULATING COUNTING
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The United States of America, as represented by the Secretary of Commerce
David Ferraiolo
G06 - COMPUTING CALCULATING COUNTING
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The United States of America, as represented by the Secretary of Commerce
Felipe Guzman
H01 - BASIC ELECTRIC ELEMENTS
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The United States of America, as represented by the Secretary of Commerce
John J. Curry
G01 - MEASURING TESTING
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Patent Application
University of Maryland, College Park
Ivan A. BURENKOV
G02 - OPTICS
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Patent Application
PsiQuantum Corp.
Faraz Najafi
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The United States of America, as represented by Secretary, Dept. of Health an...
Gary Zabow
B82 - NANO-TECHNOLOGY
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETAR
Gary Zabow
G01 - MEASURING TESTING
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Gary Zabow
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETA...
Gary Zabow
G01 - MEASURING TESTING
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Patent Application
The United States of America as represented by the Secretary of Commerce
Alfred S. Carasso
G06 - COMPUTING CALCULATING COUNTING
