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Toei Scientific Industrial Co., Ltd.
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Sendai-shi, Miyagi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus
Patent number
12,241,926
Issue date
Mar 4, 2025
Advantest Corporation
Naoyoshi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus
Patent number
11,828,798
Issue date
Nov 28, 2023
Advantest Corporation
Naoyoshi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Prober chuck for magnetic memory, and prober for magnetic memory pr...
Patent number
9,741,453
Issue date
Aug 22, 2017
TOEI SCIENTIFIC INDUSTRIAL CO., LTD.
Tomokazu Yamashiro
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
TEST APPARATUS
Publication number
20220050136
Publication date
Feb 17, 2022
Advantest Corporation
Naoyoshi WATANABE
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS
Publication number
20220050138
Publication date
Feb 17, 2022
Advantest Corporation
Naoyoshi WATANABE
G01 - MEASURING TESTING
Information
Patent Application
PROBER CHUCK FOR MAGNETIC MEMORY, AND PROBER FOR MAGNETIC MEMORY PR...
Publication number
20160012920
Publication date
Jan 14, 2016
Toei Scientific Industrial Co., Ltd.
Tomokazu Yamashiro
G01 - MEASURING TESTING
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last 30 trademarks