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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Metallic contaminant detecting method and apparatus therefor
Patent number
7,102,347
Issue date
Sep 5, 2006
Tok Engineering Co., Ltd.
Nobukazu Kondo
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting metallic foreign matter and system for detecti...
Patent number
6,958,603
Issue date
Oct 25, 2005
Tok Engineering Co., Ltd.
Nobukazu Kondo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Metallic contaminant detecting method and apparatus therefor
Publication number
20050206373
Publication date
Sep 22, 2005
TOK ENGINEERING CO., LTD
Nobukazu Kondo
G01 - MEASURING TESTING
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