Tokyo Seimitsu (Israel) Ltd.

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Hertzliya, IL

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Patents Grantslast 30 patents

Information Patent Grant
Inspection of edge periods of two-dimensional periodic structures
- Patent number 6,606,401
- Issue date Aug 12, 2003
- Tokyo Seimitsu Co. Ltd.
- Ben Zion Sender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circular scanning patterns
- Patent number 6,603,589
- Issue date Aug 5, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G01 - MEASURING TESTING

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