Tonomura; Akira

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Saitama, JP

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Patents Grantslast 30 patents

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Interference device and method for observing phase informalities
- Patent number 5,446,589
- Issue date Aug 29, 1995
- Research Development Corporation of Japan
- Qing X. Ru
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aberration correction method and aberration correction apparatus
- Patent number 5,426,521
- Issue date Jun 20, 1995
- Research Development Corporation of Japan
- Jun Chen
- G02 - OPTICS

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