TOP TECHNOLOGY PLATFORM CO., LTD

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HSINCHU CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deterioration detecting system and method for semiconductor process...
- Patent number 11,320,381
- Issue date May 3, 2022
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
- Publication number 20220283099
- Publication date Sep 8, 2022
- TOP TECHNOLOGY PLATFORM CO., LTD.
- Chyuan-Ruey LIN
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION DETECTING SYSTEM AND METHOD FOR SEMICONDUCTOR PROCESS...
- Publication number 20220034814
- Publication date Feb 3, 2022
- TOP TECHNOLOGY PLATFORM CO., LTD.
- Chyuan-Ruey LIN
- G01 - MEASURING TESTING